Interface configuration in gold/polycarbonate bilayer structure: an in situ study through Ar+ ion depth profiling
文献类型：期刊论文
| 作者 | Patnaik, A; Li, CL |
| 刊名 | APPLIED SURFACE SCIENCE
 |
| 出版日期 | 1999-02-01 |
| 卷号 | 140页码:197-203 |
| 关键词 | gold/polycarbonate bilayer structure Ar+ ion depth profiling X-ray photoelectron spectroscopy (XPS) |
| ISSN号 | 0169-4332 |
| 英文摘要 | The formation, configuration and the interactions at the gold/polycarbonate (Au/PC) interface formed by thermally evaporated Au on PC film, a technologically important polymer, is studied by X-ray photoelectron spectroscopy (XPS) at an Au thickness of 35.4 Angstrom. XPS depth profiling with 3 keV Ar+ ion sputtering at 1 mu A revealed the interface between the as-deposited 35.4 Angstrom Au film and the PC substrate to be sharp covering a few monolayers. A substantial Au atomic concentration of similar to 3% in the bulk PC indicated that Ar+ ion assisted diffusion of the metal into the bulk. Existence of weak Au --> C charge transfer interactions with Au as the electron injector distributing a net charge density at the C=O as the primary interaction site was deduced from the appearance of the 282.6 eV C-ls feature, thus resulting in the formation of Au-CO pi back bond, The sputtering experiments revealed the growth-mode of Au on PC to proceed by metal monolayer deposition followed by cluster growth on the already weakly bonded Au onto the C=O carbon of the polymeric backbone. (C) 1999 Elsevier Science B.V. All rights reserved. |
| WOS关键词 | POLYIMIDE INTERFACE ; ADHESION ; FILMS ; CHEMISTRY ; CLUSTERS ; XPS |
| WOS研究方向 | Chemistry ; Materials Science ; Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000078576900026 |
| 出版者 | ELSEVIER SCIENCE BV |
| 源URL | [http://119.78.100.186/handle/113462/36078]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Patnaik, A |
| 作者单位 | 1.Indian Inst Technol, Dept Chem, Madras 600036, Tamil Nadu, India 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China |
| 推荐引用方式 GB/T 7714 | Patnaik, A,Li, CL. Interface configuration in gold/polycarbonate bilayer structure: an in situ study through Ar+ ion depth profiling[J]. APPLIED SURFACE SCIENCE,1999,140:197-203. |
| APA | Patnaik, A,&Li, CL.(1999).Interface configuration in gold/polycarbonate bilayer structure: an in situ study through Ar+ ion depth profiling.APPLIED SURFACE SCIENCE,140,197-203. |
| MLA | Patnaik, A,et al."Interface configuration in gold/polycarbonate bilayer structure: an in situ study through Ar+ ion depth profiling".APPLIED SURFACE SCIENCE 140(1999):197-203. |
入库方式： OAI收割
来源：近代物理研究所
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