Hydrogenation properties of Zr films under various conditions of hydrogen plasma
文献类型：期刊论文
| 作者 | Yan, GQ; Shi, LQ; Zhou, ZY; Zhao, GQ; Hu, PG; Luo, SZ; Peng, SM; Ding, W; Long, XG |
| 刊名 | CHINESE PHYSICS LETTERS
 |
| 出版日期 | 2002-06-01 |
| 卷号 | 19页码:775-778 |
| ISSN号 | 0256-307X |
| 英文摘要 | The hydrogenation properties of Zr samples with and without an Ni overlayer under various plasma conditions were investigated by means of non-Rutherford backscattering and elastic recoil detection analysis. The theoretical maximum hydrogen capacity, 66.7at%, could be achieved at a hydrogen absolute pressure of similar to2Pa and a substrate temperature of similar to393K for a plasma irradiation of only 10 min; this was significantly greater than that for gas hydrogenation under the same hydrogen pressure and substrate temperature. It was also found that the C and 0 contamination on the sample surface strongly influences the hydrogenation, and that the maximum equilibrium hydrogen content drops dramatically with the increasing total contamination. In addition, the influence of the Ni overlayer on the plasma hydrogenation is discussed. |
| WOS关键词 | ABSORPTION ; KINETICS ; LAYER |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000176447400010 |
| 出版者 | CHINESE PHYSICAL SOC |
| 源URL | [http://119.78.100.186/handle/113462/37664]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Shi, LQ |
| 作者单位 | 1.Fudan Univ, Inst Modern Phys, Appl Ion Beam Phys Lab, Shanghai 200433, Peoples R China 2.China Acad Engn Phys, Inst Nucl Phys & Chem, Chengdu 610003, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yan, GQ,Shi, LQ,Zhou, ZY,et al. Hydrogenation properties of Zr films under various conditions of hydrogen plasma[J]. CHINESE PHYSICS LETTERS,2002,19:775-778. |
| APA | Yan, GQ.,Shi, LQ.,Zhou, ZY.,Zhao, GQ.,Hu, PG.,...&Long, XG.(2002).Hydrogenation properties of Zr films under various conditions of hydrogen plasma.CHINESE PHYSICS LETTERS,19,775-778. |
| MLA | Yan, GQ,et al."Hydrogenation properties of Zr films under various conditions of hydrogen plasma".CHINESE PHYSICS LETTERS 19(2002):775-778. |
入库方式： OAI收割
来源：近代物理研究所
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