中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Monte-Carlo simulation of secondary electron emission from carbon induced by H-2(+)

文献类型:期刊论文

作者Lu, QL; Zhao, GQ; Zhou, ZY
刊名JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
出版日期2002-09-01
卷号41页码:5841-5844
关键词secondary electron emission Monte-Carlo simulation effective charge contribution fraction molecular effect
ISSN号0021-4922
DOI10.1143/JJAP.41.5841
英文摘要A Monte-Carlo code for calculating secondary electron emission from carbon induced by H-2(+) ion has been developed. The projectile H-2(+) splits into cluster H+ ion and e(-) at a certain depth in the solid. H-2(+), cluster H+ + H+ and e(-) make different contributions to the total backward electron yield, and the contribution fractions are calculated using the code. The calculated molecular effect [R(Y-b)] in the backward electron emission is from 0.85 to 1.09 in the energy range from 400 keV to 3000 keV. The calculated ratios of forward to backward electron yield increase with energy and decease with target thickness. The molecular effect [R(Y-f)] in the forward electron emission decreases with target thickness for a given energy. When the projectile energy is greater than 3700 keV, ratio R(Y-f) in the forward electron emission will be greater than one [R(Y-f) > I] for the target thickness of 1000 Angstrom.
WOS关键词STOPPING POWER ; FOILS ; H-0 ; H+ ; PROJECTILES ; CLUSTERS ; SOLIDS ; YIELDS
WOS研究方向Physics
语种英语
WOS记录号WOS:000180071900077
出版者INST PURE APPLIED PHYSICS
源URL[http://119.78.100.186/handle/113462/38040]  
专题中国科学院近代物理研究所
通讯作者Zhou, ZY
作者单位Fudan Univ, Inst Modern Phys, Applied Ion Beam Phys Lab, Shanghai 200433, Peoples R China
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Lu, QL,Zhao, GQ,Zhou, ZY. Monte-Carlo simulation of secondary electron emission from carbon induced by H-2(+)[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,2002,41:5841-5844.
APA Lu, QL,Zhao, GQ,&Zhou, ZY.(2002).Monte-Carlo simulation of secondary electron emission from carbon induced by H-2(+).JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,41,5841-5844.
MLA Lu, QL,et al."Monte-Carlo simulation of secondary electron emission from carbon induced by H-2(+)".JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 41(2002):5841-5844.

入库方式: OAI收割

来源:近代物理研究所

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