中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Phonon contribution to nonionizing energy loss in silicon detectors

文献类型:期刊论文

作者Li Rong-Hua1; Li Zhan-Kui1; Yang Lei1; Li Dong-Mei2; Li Hai-Xia1; Wang Zhu-Sheng1; Chen Cui-Hong1; Tan Ji-Lian1; Liu Feng-Qiong1; Rong Xin-Juan1
刊名CHINESE PHYSICS C
出版日期2015-06-01
卷号39页码:4
关键词nonionizing energy loss silicon micro-strip detector phonon working lifetime
ISSN号1674-1137
DOI10.1088/1674-1137/39/6/066004
英文摘要Nonionizing energy loss (NIEL) has been applied to a number of studies concerning displacement damage effects in materials and devices. However, most studies consider only the contribution of displacement damage effects, neglecting the contribution from phonons. In this paper, a NIEL model, which considers the contribution of phonons, has been established using the Monte Carlo code SHIM. The maximum endurable fluence for silicon detectors has been estimated using the equivalent irradiation fluence compared with experimental data for the incident particles. NIEL is proportional to the equivalent irradiation fluence that the detector has received.
WOS关键词HEAVY-IONS ; NIEL CALCULATIONS
资助项目National Natural Science Foundation of China[11175223] ; National Natural Science Foundation of China[11305231] ; National Natural Science Foundation of China[11205220]
WOS研究方向Physics
语种英语
WOS记录号WOS:000355571700013
出版者CHINESE PHYSICAL SOC
资助机构National Natural Science Foundation of China
源URL[http://119.78.100.186/handle/113462/39917]  
专题中国科学院近代物理研究所
通讯作者Li Rong-Hua
作者单位1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
2.Nanyang Inst Technol, Comp & Informat Engn Inst, Nanyang 473004, Peoples R China
推荐引用方式
GB/T 7714
Li Rong-Hua,Li Zhan-Kui,Yang Lei,et al. Phonon contribution to nonionizing energy loss in silicon detectors[J]. CHINESE PHYSICS C,2015,39:4.
APA Li Rong-Hua.,Li Zhan-Kui.,Yang Lei.,Li Dong-Mei.,Li Hai-Xia.,...&Lu Zi-Wei.(2015).Phonon contribution to nonionizing energy loss in silicon detectors.CHINESE PHYSICS C,39,4.
MLA Li Rong-Hua,et al."Phonon contribution to nonionizing energy loss in silicon detectors".CHINESE PHYSICS C 39(2015):4.

入库方式: OAI收割

来源:近代物理研究所

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