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Strain Effect on Critical Current Degradation in Bi-Based Superconducting Tapes With Different Deformation Modes

文献类型：期刊论文

作者Gao, Peifeng1; Xin, Canjie1; Guan, Mingzhi2; Wang, Xingzhe1; Zhou, Youhe1
刊名IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
出版日期2016-06-01
卷号26页码:5
关键词Terms-Critical current degradation deformation modes empirical degradation model superconducting tape
ISSN号1051-8223
DOI10.1109/TASC.2016.2539921
英文摘要A 77-K cryostat system combined with different mechanical loading fixtures has been designed and fabricated to provide various strainmodes for Bi-based superconducting tapes. The relations of the corresponding critical current of superconducting tapes and the applied strains are measured. The observations show that the critical current degradation of Bi-2223 superconducting tapes under small strains for different deformation modes is recoverable. While the deformation of tapes increases and exceeds some certain strain values, it is clarified that the critical current and n-value degrade significantly with an irreversible process. The degradation of critical current in Bi-2223 tapes under tension strain is much greater compared to those of bending and torsion strains. To quantitatively predict the degradation dependence upon strains of superconducting tapes, a generalized empirical degradation model based on Ekin's exponential model and Weibull's distribution function is developed for capturing the critical current degradation behavior under different deformation modes. The theoretical predictions exhibit quite good agreement with the experimental data for the critical current degradation of Bi-2223 superconducting tapes under axial, bending, and torsion strains, respectively.
资助项目National Key Project of ITER on Magneto-Constrained Fusion Energy Development Program[2013GB-110002B] ; National Key Project of Scientific Instrument and Equipment Development[11327802] ; Fund of Innovative Research Groups of the NNSFC[11421062] ; National Natural Science Foundation of China[11302225] ; Fundamental Research for the Central Universities[lzujbky-2015-235]
WOS研究方向Engineering ; Physics
语种英语
WOS记录号WOS:000373944800001
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
资助机构National Key Project of ITER on Magneto-Constrained Fusion Energy Development Program ; National Key Project of Scientific Instrument and Equipment Development ; Fund of Innovative Research Groups of the NNSFC ; National Natural Science Foundation of China ; Fundamental Research for the Central Universities
源URL[http://119.78.100.186/handle/113462/42211]  
专题中国科学院近代物理研究所
通讯作者Wang, Xingzhe
作者单位1.Lanzhou Univ, Coll Civil Engn & Mech, Key Lab Mech Environm & Disaster Western China, Key Lab Special Funct Mat & Struct Design,Minist, Lanzhou 730000, Peoples R China
2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
推荐引用方式
GB/T 7714		 Gao, Peifeng,Xin, Canjie,Guan, Mingzhi,et al. Strain Effect on Critical Current Degradation in Bi-Based Superconducting Tapes With Different Deformation Modes[J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY,2016,26:5.
APA Gao, Peifeng,Xin, Canjie,Guan, Mingzhi,Wang, Xingzhe,&Zhou, Youhe.(2016).Strain Effect on Critical Current Degradation in Bi-Based Superconducting Tapes With Different Deformation Modes.IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY,26,5.
MLA Gao, Peifeng,et al."Strain Effect on Critical Current Degradation in Bi-Based Superconducting Tapes With Different Deformation Modes".IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY 26(2016):5.

入库方式： OAI收割

来源：近代物理研究所

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