Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs
文献类型：期刊论文
| 作者 | Yang, Zhen-Lei1,2; Wang, Xiao-Hui1; Zhang, Zhan-Gang3; Liu, Jie1 ; Su, Hong1
|
| 刊名 | CHINESE PHYSICS C
 |
| 出版日期 | 2016-04-01 |
| 卷号 | 40页码:9 |
| 关键词 | single event effects flash-based FPGAs BRAMs error correcting codes Hamming codes BCH codes |
| ISSN号 | 1674-1137 |
| DOI | 10.1088/1674-1137/40/4/046103 |
| 英文摘要 | Embedded RAM blocks (BRAMs) in field programmable gate arrays (FPGAs) are susceptible to single event effects (SEEs) induced by environmental factors such as cosmic rays, heavy ions, alpha particles and so on. As technology scales, the issue will be more serious. In order to tackle this issue, two different error correcting codes (ECCs), the shortened Hamming codes and shortened BCH codes, are investigated in this paper. The concrete design methods of the codes are presented. Also, the codes are both implemented in flash-based FPGAs. Finally, the synthesis report and simulation results are presented in the paper. Moreover, heavy-ion experiments are performed, and the experimental results indicate that the error cross-section of the device using the shortened Hamming codes can be reduced by two orders of magnitude compared with the device without mitigation, and no errors are discovered in the experiments for the device using the shortened BCH codes. |
| WOS关键词 | CODES |
| 资助项目 | National Natural Science Foundation of China[11079045] ; National Natural Science Foundation of China[11179003] ; National Natural Science Foundation of China[11305233] |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000374121600011 |
| 出版者 | CHINESE PHYSICAL SOC |
| 资助机构 | National Natural Science Foundation of China |
| 源URL | [http://119.78.100.186/handle/113462/42337]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Su, Hong |
| 作者单位 | 1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 3.China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Guangdong, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yang, Zhen-Lei,Wang, Xiao-Hui,Zhang, Zhan-Gang,et al. Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs[J]. CHINESE PHYSICS C,2016,40:9. |
| APA | Yang, Zhen-Lei,Wang, Xiao-Hui,Zhang, Zhan-Gang,Liu, Jie,&Su, Hong.(2016).Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs.CHINESE PHYSICS C,40,9. |
| MLA | Yang, Zhen-Lei,et al."Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs".CHINESE PHYSICS C 40(2016):9. |
入库方式： OAI收割
来源：近代物理研究所
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