An attempt to apply the inelastic thermal spike model to surface modifications of CaF2 induced by highly charged ions: comparison to swift heavy ions effects and extension to some others material
文献类型：期刊论文
| 作者 | Dufour, C.1; Khomrenkov, V.1; Wang, Y. Y.2,3; Wang, Z. G.2; Aumayr, F.3; Toulemonde, M.1 |
| 刊名 | JOURNAL OF PHYSICS-CONDENSED MATTER
 |
| 出版日期 | 2017-03-08 |
| 卷号 | 29页码:16 |
| ISSN号 | 0953-8984 |
| 关键词 | transient thermal process highly charged ions swift heavy ions ion tracks CaF2 SiO2 SrTiO3 TiO2 |
| DOI | 10.1088/1361-648X/aa547a |
| 英文摘要 | Surface damage appears on materials irradiated by highly charged ions (HCI). Since a direct link has been found between surface damage created by HCI with the one created by swift heavy ions (SHI), the inelastic thermal spike model (i-TS model) developed to explain track creation resulting from the electron excitation induced by SHI can also be applied to describe the response of materials under HCI which transfers its potential energy to electrons of the target. An experimental description of the appearance of the hillock-like nanoscale protrusions induced by SHI at the surface of CaF2 is presented in comparison with track formation in bulk which shows that the only parameter on which we can be confident is the electronic energy loss threshold. Track size and electronic energy loss threshold resulting from SHI irradiation of CaF2 is described by the i-TS model in a 2D geometry. Based on this description the i-TS model is extended to three dimensions to describe the potential threshold of appearance of protrusions by HCI in CaF2 and to other crystalline materials (LiF, crystalline SiO2, mica, LiNbO3, SrTiO3, ZnO, TiO2, HOPG). The strength of the electron-phonon coupling and the depth in which the potential energy is deposited near the surface combined with the energy necessary to melt the material defines the classification of the material sensitivity. As done for SHI, the band gap of the material may play an important role in the determination of the depth in which the potential energy is deposited. Moreover larger is the initial potential energy and larger is the depth in which it is deposited. |
| WOS关键词 | SCANNING FORCE MICROSCOPY ; NANO-HILLOCK FORMATION ; YTTRIUM-IRON-GARNET ; TRACK FORMATION ; INSULATOR SURFACES ; POTENTIAL-ENERGY ; LATENT TRACKS ; INORGANIC INSULATORS ; ELECTRON-EMISSION ; INDUCED DAMAGE |
| 资助项目 | National Natural Science of China (NSFC)[11275238] ; French -Chinese cooperation project IiN by PICS-CNRS (France) ; NSFC[11411130112] |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| 出版者 | IOP PUBLISHING LTD |
| WOS记录号 | WOS:000395096600001 |
| 资助机构 | National Natural Science of China (NSFC) ; French -Chinese cooperation project IiN by PICS-CNRS (France) ; NSFC |
| 源URL | [http://119.78.100.186/handle/113462/44388]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Dufour, C. |
| 作者单位 | 1.Univ Caen Basse Normandie, ENSICAEN, CNRS, CEA,CIMAP, BP5133, F-14070 Caen 5, France 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 3.Vienna Univ Technol, TU Wien, Inst Appl Phys, A-1040 Vienna, Austria |
| 推荐引用方式 GB/T 7714 | Dufour, C.,Khomrenkov, V.,Wang, Y. Y.,et al. An attempt to apply the inelastic thermal spike model to surface modifications of CaF2 induced by highly charged ions: comparison to swift heavy ions effects and extension to some others material[J]. JOURNAL OF PHYSICS-CONDENSED MATTER,2017,29:16. |
| APA | Dufour, C.,Khomrenkov, V.,Wang, Y. Y.,Wang, Z. G.,Aumayr, F.,&Toulemonde, M..(2017).An attempt to apply the inelastic thermal spike model to surface modifications of CaF2 induced by highly charged ions: comparison to swift heavy ions effects and extension to some others material.JOURNAL OF PHYSICS-CONDENSED MATTER,29,16. |
| MLA | Dufour, C.,et al."An attempt to apply the inelastic thermal spike model to surface modifications of CaF2 induced by highly charged ions: comparison to swift heavy ions effects and extension to some others material".JOURNAL OF PHYSICS-CONDENSED MATTER 29(2017):16. |
入库方式： OAI收割
来源：近代物理研究所
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