PIXE, SR-XRD and EXAFS analysis of Cu-doped ZnO films
文献类型:期刊论文
作者 | Zhang, B.1; Yang, C.; Wang, J. Z.; Shi, L. Q.; Cheng, H. S. |
刊名 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
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出版日期 | 2014-08-01 |
卷号 | 332页码:126-129 |
关键词 | Pixe Exafs Zno-based Dms Cu Substitution |
ISSN号 | 0168-583X |
DOI | 10.1016/j.nimb.2014.02.044 |
文献子类 | Article |
英文摘要 | Cu-doped ZnO films were prepared by rf magnetron sputtering on sapphire substrate at different atmosphere. Microstructure of these films and Cu occupation sites were investigated using PIXE, SR-XRD and EXAFS. Only 2.9 at.% Cu, no other magnetic impurities (e.g., Fe, Co and Ni) were detected. The ZnO:Cu films possessed the wurtzite ZnO structures and no precipitates (e.g., CuO and Cu2O or Cu cluster) were found. Cu atoms were incorporated into ZnO crystal lattice by occupying Zn atomic sites. (C) 2014 Elsevier B.V. All rights reserved. |
WOS关键词 | ROOM-TEMPERATURE FERROMAGNETISM ; DILUTED MAGNETIC SEMICONDUCTORS ; GAN FILM |
语种 | 英语 |
WOS记录号 | WOS:000339131200028 |
出版者 | ELSEVIER SCIENCE BV |
源URL | [http://119.78.100.186/handle/113462/49455] ![]() |
专题 | 中国科学院近代物理研究所 |
通讯作者 | Zhang, B. |
作者单位 | 1.Fudan Univ, Inst Modern Phys, Minist Educ, Appl Ion Beam Phys Lab,Key Lab, Shanghai 200433, Peoples R China 2.Fudan Univ, Dept Nucl Sci & Technol, Shanghai 200433, Peoples R China |
推荐引用方式 GB/T 7714 | Zhang, B.,Yang, C.,Wang, J. Z.,et al. PIXE, SR-XRD and EXAFS analysis of Cu-doped ZnO films[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2014,332:126-129. |
APA | Zhang, B.,Yang, C.,Wang, J. Z.,Shi, L. Q.,&Cheng, H. S..(2014).PIXE, SR-XRD and EXAFS analysis of Cu-doped ZnO films.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,332,126-129. |
MLA | Zhang, B.,et al."PIXE, SR-XRD and EXAFS analysis of Cu-doped ZnO films".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 332(2014):126-129. |
入库方式: OAI收割
来源:近代物理研究所
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