The Contradiction Behavior Between Mechanical Performance and Degradation Mechanism of Electric at Cryogenic Temperature in Bi-2222/Ag Tapes with Different Protective Layer
文献类型：期刊论文
| 作者 | Guan, Mingzhi1,2; Wang, Xingzhe1; Xin, Canjie1; Wu, Wei2 ; Ma, Lizhen2
|
| 刊名 | JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM
 |
| 出版日期 | 2014-10-01 |
| 卷号 | 27页码:2257-2262 |
| 关键词 | Bi-2222 / Ag Superconducting Tapes Tensile Performance Bending Strain Degradation Mechanism Protective Layers |
| ISSN号 | 1557-1939 |
| DOI | 10.1007/s10948-014-2581-5 |
| 文献子类 | Article |
| 英文摘要 | The mechanical performance at cryogenic temperature and the degradation mechanism of electric behaviors of Bi-2222/Ag tapes with different protective layers as well as their contradiction laws are discussed. A variable temperature cryostat system is constructed to provide the successive cooling environment from room temperature (RT) to the liquid nitrogen temperature (LNT), and a cryogenic-type extensometer is also used to measure strain behavior of the superconducting tapes. And, the effects of bending strain on the critical current of Bi-2222/Ag tapes with different protective layer were measured using arched abrasives with different radius. Experimented results have shown that the protective layer of the tapes could have strong positive effects on the measured mechanical performance at room temperature and cryogenic temperature. The irreversible degradation on strain indicates that the I-c reduction is caused mainly by crack formation and propagation in the brittle Bi-2222/Ag tapes. In particular, the degradation mechanism of multifilamentary sample with protective layer was also elaborated, and protective layer has some negative effect on electric behaviors. In addition, the behaviors of the n value with strains on standard Bi2222/Ag tape was also argued to predict the damage process in Bi-2222 tapes indirectly during bending tests. |
| WOS关键词 | SUPERCONDUCTING TAPES ; BI-2223/AG TAPES ; STRAIN |
| 资助项目 | Foundation for Innovative Research Groups of NNSFC[11121202] |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000343162400012 |
| 出版者 | SPRINGER |
| 源URL | [http://119.78.100.186/handle/113462/49623]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Guan, Mingzhi |
| 作者单位 | 1.Lanzhou Univ, Coll Civil Engn & Mech, Key Lab Mech Disaster & Environm Western China, Minist Educ China, Lanzhou 730000, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China |
| 推荐引用方式 GB/T 7714 | Guan, Mingzhi,Wang, Xingzhe,Xin, Canjie,et al. The Contradiction Behavior Between Mechanical Performance and Degradation Mechanism of Electric at Cryogenic Temperature in Bi-2222/Ag Tapes with Different Protective Layer[J]. JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM,2014,27:2257-2262. |
| APA | Guan, Mingzhi,Wang, Xingzhe,Xin, Canjie,Wu, Wei,&Ma, Lizhen.(2014).The Contradiction Behavior Between Mechanical Performance and Degradation Mechanism of Electric at Cryogenic Temperature in Bi-2222/Ag Tapes with Different Protective Layer.JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM,27,2257-2262. |
| MLA | Guan, Mingzhi,et al."The Contradiction Behavior Between Mechanical Performance and Degradation Mechanism of Electric at Cryogenic Temperature in Bi-2222/Ag Tapes with Different Protective Layer".JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM 27(2014):2257-2262. |
入库方式： OAI收割
来源：近代物理研究所
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