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A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs

文献类型：期刊论文

作者Shi, Zhan1,2; Zhao, Ruifeng1,2; Li, Wenxian1,2; Tu, Bingsheng1,2; Yang, Yang1,2; Xiao, Jun1,2; Huldt, Sven3; Hutton, Roger1,2; Zou, Yaming1,2
刊名REVIEW OF SCIENTIFIC INSTRUMENTS
出版日期2014-06-01
卷号85
ISSN号0034-6748
DOI10.1063/1.4876597
文献子类Article
英文摘要A portable high resolution soft x-ray and extreme ultraviolet (EUV) spectrometer has been developed for spectroscopic research at the Shanghai Electron Beam Ion Trap (EBIT) laboratory. A unique way of aligning the grazing incidence spectrometer using the zero order of the grating is introduced. This method is realized by extending the range of the movement of the CCD detector to cover the zero order. The alignment can be done in a few minutes, thus leading to a portable spectrometer. The high vacuum needed to be compatible with the EBITs is reached by mounting most of the translation and rotation stages outside the chamber. Only one high vacuum compatible linear guide is mounted inside the chamber. This is to ensure the convenient interchange of the gratings needed to enable wavelength coverage of the whole range of 10 to 500 angstrom. Spectra recorded with one of our low energy EBITs shows that a resolving power of above 800 can be achieved. In the slitless configuration used in this work, we found the resolving power to be limited by the width of the EBIT plasma. When mounted on the Shanghai EBIT which is a high energy EBIT and has a narrower EBIT plasma width, the estimated resolving power will be around 1400 at 221.15 angstrom. (C) 2014 AIP Publishing LLC.
WOS关键词BEAM ION-TRAP ; CORRECTED CONCAVE GRATINGS ; CHARGED IONS ; SPECTROSCOPY ; TUNGSTEN ; ASTROPHYSICS ; SPECTROGRAPH ; RELEVANT ; EMISSION ; PLASMAS
语种英语
WOS记录号WOS:000339010500011
出版者AMER INST PHYSICS
源URL[http://119.78.100.186/handle/113462/49847]  
专题中国科学院近代物理研究所
通讯作者Yang, Yang
作者单位1.Fudan Univ, Inst Modern Phys, IEBIT Lab, Shanghai 200433, Peoples R China
2.Fudan Univ, Key Lab Appl Ion Beam Phys, Minist Educ, Shanghai 200433, Peoples R China
3.Lund Univ, Lund Observ, SE-22100 Lund, Sweden
推荐引用方式
GB/T 7714		 Shi, Zhan,Zhao, Ruifeng,Li, Wenxian,et al. A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,2014,85.
APA Shi, Zhan.,Zhao, Ruifeng.,Li, Wenxian.,Tu, Bingsheng.,Yang, Yang.,...&Zou, Yaming.(2014).A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs.REVIEW OF SCIENTIFIC INSTRUMENTS,85.
MLA Shi, Zhan,et al."A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs".REVIEW OF SCIENTIFIC INSTRUMENTS 85(2014).

入库方式： OAI收割

来源：近代物理研究所

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