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Simulation of the characteristics of low-energy proton induced single event upset

文献类型：期刊论文

作者Geng Chao1,2; Xi Kai1,2; Liu TianQi1,2; Liu Jie1
刊名SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY
出版日期2014-10-01
卷号57页码:1902-1906
关键词Single Event Upset Proton Direct Ionization Monte Carlo
ISSN号1674-7348
DOI10.1007/s11433-014-5414-4
文献子类Article
英文摘要Monte Carlo simulation results are reported on the single event upset (SEU) triggered by the direct ionization effect of low-energy proton. The SEU cross-sections on the 45 nm static random access memory (SRAM) were compared with previous research work, which not only validated the simulation approach used herein, but also exposed the existence of saturated cross-section and the multiple bit upsets (MBUs) when the incident energy was less than 1 MeV. Additionally, it was observed that the saturated cross-section and MBUs are involved with energy loss and critical charge. The amount of deposited charge and the distribution with respect to the critical charge as the supplemental evidence are discussed.
WOS关键词SILICON ; IONIZATION ; DEPOSITION ; GEANT4 ; MODELS ; SRAM
资助项目National Natural Science Foundation of China[11179003] ; National Natural Science Foundation of China[0975164] ; National Natural Science Foundation of China[10805062] ; National Natural Science Foundation of China[11005134]
WOS研究方向Physics
语种英语
WOS记录号WOS:000340498300015
出版者SCIENCE PRESS
源URL[http://119.78.100.186/handle/113462/49913]  
专题中国科学院近代物理研究所
通讯作者Liu Jie
作者单位1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100190, Peoples R China
推荐引用方式
GB/T 7714		 Geng Chao,Xi Kai,Liu TianQi,et al. Simulation of the characteristics of low-energy proton induced single event upset[J]. SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY,2014,57:1902-1906.
APA Geng Chao,Xi Kai,Liu TianQi,&Liu Jie.(2014).Simulation of the characteristics of low-energy proton induced single event upset.SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY,57,1902-1906.
MLA Geng Chao,et al."Simulation of the characteristics of low-energy proton induced single event upset".SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY 57(2014):1902-1906.

入库方式： OAI收割

来源：近代物理研究所

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