Production of highly charged ion beams with the Grenoble test electron cyclotron resonance ion source (plenary)
文献类型:会议论文
作者 | Hitz, D; Girard, A; Serebrennikov, K; Melin, G; Cormier, D; Mathonnet, JM; Chartier, J; Sun, L; Briand, JP; Benhachoum, M |
出版日期 | 2004-05 |
卷号 | 75 |
期号 | 5 |
DOI | 10.1063/1675930 |
页码 | 1403-1406 |
英文摘要 | Grenoble Test Source (GTS) is a room temperature electron cyclotron resonance ion source whose purpose is to deepen the knowledge of this type of device. GTS was designed according to magnetic scaling laws determined with the SERSE source [Hitz et al., Rev. Sci. Instrum. 73, 509 (2002); Gammino et al., ibid. 72, 4090 (2001)] while keeping enough flexibility in terms of magnetic confinement and rf heating to determine best conditions for the production of intense beams of any charge state. First results were presented 1 year ago [Hitz et al., 8th European Particle Accelerator Conference, 2002; 15th International Workshop on ECR Ion Sources, 2002]. Since then, some improvements have been performed mostly in the magnetic confinement, beam extraction and analysis. Updated ion beam intensities are presented: e.g., 0.5 mA of Ar11+ at 18 GHz, 20 muA of Ar16+ and 1.8 muA of Ar17+ when GTS is operated at 14.5 GHz. On the other hand, charge coupled device imagers have been installed to diagnose and monitor the ion beam and some beam images are shown. (C) 2004 American Institute of Physics. |
会议录 | REVIEW OF SCIENTIFIC INSTRUMENTS
![]() |
会议录出版者 | AMER INST PHYSICS |
会议录出版地 | CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA |
语种 | 英语 |
WOS研究方向 | Instruments & Instrumentation ; Physics |
WOS记录号 | WOS:000221872500006 |
源URL | [http://119.78.100.186/handle/113462/57507] ![]() |
专题 | 中国科学院近代物理研究所 |
通讯作者 | Hitz, D |
作者单位 | 1.CEA, DRFM, SBT, F-38054 Grenoble 9, France 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 3.Univ Paris 06, ERIS, Paris, France |
推荐引用方式 GB/T 7714 | Hitz, D,Girard, A,Serebrennikov, K,et al. Production of highly charged ion beams with the Grenoble test electron cyclotron resonance ion source (plenary)[C]. 见:. |
入库方式: OAI收割
来源:近代物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。