Experimental investigation of single capture with single ionization in 30keV/u He2+ on argon collisions
文献类型:会议论文
作者 | Zhang, R. T.1,2; Ma, X.2; Zhang, S. F.2; Zhu, X. L.2; Feng, W. T.2; Guo, D. L.1,2; Wang, Q.1,2; Williams, ID; VanDerHart, HW; McCann, JF |
出版日期 | 2012 |
卷号 | 388 |
DOI | 10.1088/1742-6596/388/8/082006 |
英文摘要 | Applying reaction microscope, electron emission from single capture with simultaneous single ionization in 30keV/u He2+ on argon collisions was studied. Intensive peak near zero energy and electron-capture-to-the-continuum peak are obtained. It is demonstrated that low energy electrons mainly result from direct transfer ionization. |
会议录 | XXVII INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC AND ATOMIC COLLISIONS (ICPEAC 2011), PTS 1-15
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会议录出版者 | IOP PUBLISHING LTD |
会议录出版地 | DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND |
语种 | 英语 |
资助项目 | Major State Basic Research Development Program of China (973' Program)[2010CB832902] |
WOS研究方向 | Physics |
WOS记录号 | WOS:000314994700473 |
源URL | [http://119.78.100.186/handle/113462/57709] ![]() |
专题 | 中国科学院近代物理研究所 |
通讯作者 | Zhang, R. T. |
作者单位 | 1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 2.Grad Univ Chinese Acad Sci, Beijing 100039, Peoples R China |
推荐引用方式 GB/T 7714 | Zhang, R. T.,Ma, X.,Zhang, S. F.,et al. Experimental investigation of single capture with single ionization in 30keV/u He2+ on argon collisions[C]. 见:. |
入库方式: OAI收割
来源:近代物理研究所
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