Defects in SiO2 glass irradiated with high energy Ar ions
文献类型：会议论文
| 作者 | Zhu, ZY; Jin, YF; Li, CL; Sun, YM; Zhang, CH; Meng, GH |
| 出版日期 | 1998-12 |
| 关键词 | irradiation defect SiO2 glass |
| 卷号 | 146 |
| 期号 | 1-4 |
| 页码 | 455-461 |
| 英文摘要 | SiO2 glass specimens are irradiated at room temperature with 560 MeV and 1.15 GeV Ar ions. Defect production is investigated by positron lifetime spectra, EPR and UV absorption measurements. Free volumes of about 0.065 nm(3) in size are found to be present in the virgin specimen from the corresponding Ortho-Positronium lifetimes. With increasing dose the intensity of the component corresponding to positronium decreases sharply. This is attributed to the preferred annihilation of positrons with the radiation-ionized-electrons wandering in free volumes of the material. Optical absorption bands are induced at about 5.8, 5 and 4.5 eV by the irradiations and the absorption coefficients increase gradually with increasing dose. The EPR spectra of the irradiated specimens show the occurrence of the E' center, the number density of which reveals two distinct regimes according to its dependence on dose. In the low dose range the number density of E' center follows a 0.23 power law dose dependence whereas at high dose it increases linearly with dose. Furthermore the EPR spectra show fine structure which changes with dose. (C) 1998 Elsevier Science B.V. All rights reserved. |
| 会议录 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
 |
| 会议录出版者 | ELSEVIER SCIENCE BV |
| 会议录出版地 | PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS |
| 语种 | 英语 |
| WOS研究方向 | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics |
| WOS记录号 | WOS:000077719400069 |
| 源URL | [http://119.78.100.186/handle/113462/58126]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Zhu, ZY |
| 作者单位 | Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhu, ZY,Jin, YF,Li, CL,et al. Defects in SiO2 glass irradiated with high energy Ar ions[C]. 见:. |
入库方式： OAI收割
来源：近代物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。