Irradiation effect of swift heavy ions on C-60 films
文献类型：会议论文
| 作者 | Jin, YF; Tian, HX; Xie, EQ; Liu, J; Wang, ZG; Sun, Y; Zhu, ZY |
| 出版日期 | 2002-06 |
| 关键词 | strong electronic excitation annealing effect velocity effect C-60 film swift heavy ion |
| 卷号 | 193 |
| 页码 | 288-293 |
| 英文摘要 | In this paper we present experimental results on irradiation effects of C-60 films induced by 2.0 GeV Xe-136 ions, delivered by HIRFL at Lanzhou of China. The irradiated C-60 films were analyzed by means of Fourier transform infrared, Raman scattering and X-ray diffraction spectroscopies. The analysis results indicated that electronic energy transfer dominates the damage process of C-60 films. The partial recovery of the damage in irradiated C-60 films at certain electronic energy loss is attributed to an annealing effect of strong electronic excitation. The ion velocity also plays a role in the process of the damage creation. (C) 2002 Elsevier Science B.V. All rights reserved. |
| 会议录 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
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| 会议录出版者 | ELSEVIER SCIENCE BV |
| 会议录出版地 | PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS |
| 语种 | 英语 |
| WOS研究方向 | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics |
| WOS记录号 | WOS:000177055500048 |
| 源URL | [http://119.78.100.186/handle/113462/58263]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Jin, YF |
| 作者单位 | 1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 2.Lanzhou Univ, Dept Phys, Lanzhou 730000, Peoples R China |
| 推荐引用方式 GB/T 7714 | Jin, YF,Tian, HX,Xie, EQ,et al. Irradiation effect of swift heavy ions on C-60 films[C]. 见:. |
入库方式： OAI收割
来源：近代物理研究所
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