Influence of heavy ion flux on single event effect testing in memory devices
文献类型：会议论文
| 作者 | Xi, Kai1; Luo, Jie1,2,3 ; Liu, Jie1; Sun, Youmei1; Hou, Mingdong1; Liu, Tianqi1; Wang, Bin1; Ye, Bing1
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| 出版日期 | 2017-09 |
| 关键词 | Swift heavy ions Ion flux Single event effect Memory device |
| 卷号 | 406 |
| DOI | 10.1016/j.nimb.2017.04.038 |
| 页码 | 431-436 |
| 英文摘要 | The natural space presents a particle flux variable environment and choosing a suitable flux value for ground-based single event experiments is an unresolved problem so far. In this work, various types of memory devices have been tested over the ion flux range from 10 to 10(5) ions/(cm(2).s) using different ions covering LET from 10.1 to 99.8 MeV.cm(2)/mg. It was found that for most devices the error rates of single event upsets are affected by the applied flux value. And the effect involving flux becomes prominent as it is increased above 10(3) ions/(cm(2).s). Different devices behave differently as the flux is increased and the flux effect depends strongly on the LET of the impinging ions. The results concluded in this experiment are discussed in detail and recommendations for choosing appropriate experimental flux are given. (C) 2017 Elsevier B.V. All rights reserved. |
| 会议录 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
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| 会议录出版者 | ELSEVIER SCIENCE BV |
| 会议录出版地 | PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS |
| 语种 | 英语 |
| WOS研究方向 | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics |
| WOS记录号 | WOS:000407659500007 |
| 源URL | [http://119.78.100.186/handle/113462/58495]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Liu, Jie |
| 作者单位 | 1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Gansu, Peoples R China 2.Lanzhou Univ, Sch Nucl Sci & Technol, Lanzhou 730000, Gansu, Peoples R China 3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China |
| 推荐引用方式 GB/T 7714 | Xi, Kai,Luo, Jie,Liu, Jie,et al. Influence of heavy ion flux on single event effect testing in memory devices[C]. 见:. |
入库方式： OAI收割
来源：近代物理研究所
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