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Irradiation effect of swift heavy ions on C60 films

文献类型：会议论文

作者Jin, Y.F.1; Tian, H.X.1; Xie, E.Q.2; Liu, J.1; Wang, Z.G.1; Sun, Y.1; Zhu, Z.Y.1
出版日期2002
卷号193
期号1-4
DOI10.1016/S0168-583X(02)00776-0
页码288-293
英文摘要In this paper we present experimental results on irradiation effects of C60 films induced by 2.0 GeV Xe136 ions, delivered by HIRFL at Lanzhou of China. The irradiated C60 films were analyzed by means of Fourier transform infrared, Raman scattering and X-ray diffraction spectroscopies. The analysis results indicated that electronic energy transfer dominates the damage process of C60 films. The partial recovery of the damage in irradiated C60 films at certain electronic energy loss is attributed to an annealing effect of strong electronic excitation. The ion velocity also plays a role in the process of the damage creation. © 2002 Elsevier Science B.V. All rights reserved.
会议录Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
会议录出版者Elsevier
源URL[http://119.78.100.186/handle/113462/63963]  
专题中国科学院近代物理研究所
通讯作者Jin, Y.F.
作者单位1.Institute of Modern Physics, Chinese Academy of Sciences, P.O. Box 31, Lanzhou 730 000, China
2.Department of Physics, Lanzhou University, Lanzhou 730 000, China
推荐引用方式
GB/T 7714		 Jin, Y.F.,Tian, H.X.,Xie, E.Q.,et al. Irradiation effect of swift heavy ions on C60 films[C]. 见:.

入库方式： OAI收割

来源：近代物理研究所

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