Testing system circuit for front-end ASIC of silicon strip detector
文献类型：期刊论文
| 作者 | Qian, Yi ; Su, Hong; Xu, Sijiu; Li, Xiaogang
|
| 刊名 | He Jishu/Nuclear Techniques
 |
| 出版日期 | 2008 |
| 卷号 | 31页码:229-232 |
| ISSN号 | 0253-3219 |
| 英文摘要 | A testing system circuit we designed for front-end ASIC of Silicon strip detector is reported in this paper. This ASIC chip can also be used as the front-end electronics for silicon micro-strip, Si(Li) and Csl detectors. The circuit configuration of the test system, circuit design and testing results are described in details. Also, the architecture of the ASIC is introduced briefly. |
| 出版者 | Science Press, Beijing, 100085, China |
| 源URL | [http://119.78.100.186/handle/113462/64075]  |
| 专题 | 中国科学院近代物理研究所 |
| 作者单位 | 1.Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China 2.Graduate School, Chinese Academy of Sciences, Beijing 100049, China |
| 推荐引用方式 GB/T 7714 | Qian, Yi,Su, Hong,Xu, Sijiu,et al. Testing system circuit for front-end ASIC of silicon strip detector[J]. He Jishu/Nuclear Techniques,2008,31:229-232. |
| APA | Qian, Yi,Su, Hong,Xu, Sijiu,&Li, Xiaogang.(2008).Testing system circuit for front-end ASIC of silicon strip detector.He Jishu/Nuclear Techniques,31,229-232. |
| MLA | Qian, Yi,et al."Testing system circuit for front-end ASIC of silicon strip detector".He Jishu/Nuclear Techniques 31(2008):229-232. |
入库方式： OAI收割
来源：近代物理研究所
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