Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam
文献类型：期刊论文
| 作者 | Yang, Weitao1; Du, Xuecheng1; Guo, Jinlong2 ; Wei, Junze2; Du, Guanghua2; He, Chaohui1; Liu, Wenjing2; Shen, Shuaishuai1; Huang, Chengliang1; Li, Yonghong1
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| 刊名 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
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| 出版日期 | 2019-07-01 |
| 卷号 | 450页码:323-326 |
| 关键词 | Single event effect (SEE) System on Chip (SoC) Heavy ion microbeam On-chip-memory (OCM) |
| ISSN号 | 0168-583X |
| DOI | 10.1016/j.nimb.2018.09.038 |
| 通讯作者 | He, Chaohui() |
| 英文摘要 | The SEE susceptibility on 28 nm Xilinx Zynq-7020 All Programmable SoC was investigated at heavy ion microbeam facilities in Institute of Modem Physics (IMP). The sensitive SEE spots distribution in entire PS area was obtained by running the on chip memory (OCM) test program. The extracted chip bottom modules layout information indicated that the SEE sensitive events occurred in the OCM area, central data processing area, and interfaces controlling buffer registers elements area, accounting for 19.6%, 32.6% and 47.8%, respectively. The results showed it was possible that the SEE events in other areas appeared more serious than in the target block located area. Meanwhile, the partial cross section was gotten in the test and it was (5.75 +/- 0.85) x 10(-5) cm(2). |
| WOS关键词 | XILINX 28-NM SYSTEM ; DESIGN ; UPSET |
| 资助项目 | National Natural Science Foundation of China[11575138] ; Key Program of the National Natural Science Foundation of China[11235008] |
| WOS研究方向 | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000474501400066 |
| 出版者 | ELSEVIER SCIENCE BV |
| 资助机构 | National Natural Science Foundation of China ; Key Program of the National Natural Science Foundation of China |
| 源URL | [http://119.78.100.186/handle/113462/133089]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | He, Chaohui |
| 作者单位 | 1.Xi An Jiao Tong Univ, Sch Nucl Sci & Technol, Xian, Shaanxi, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou, Gansu, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yang, Weitao,Du, Xuecheng,Guo, Jinlong,et al. Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2019,450:323-326. |
| APA | Yang, Weitao.,Du, Xuecheng.,Guo, Jinlong.,Wei, Junze.,Du, Guanghua.,...&Fan, Yunyun.(2019).Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,450,323-326. |
| MLA | Yang, Weitao,et al."Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 450(2019):323-326. |
入库方式： OAI收割
来源：近代物理研究所
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