Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits
文献类型：期刊论文
| 作者 | Xu, Liewei1; Cai, Chang2,3; Liu, Tianqi2,3; Ke, Lingyun2,3; Yu, Jun1; Wu, Chang1 |
| 刊名 | IEICE ELECTRONICS EXPRESS
 |
| 出版日期 | 2019-05-25 |
| 卷号 | 16期号:10页码:6 |
| 关键词 | FPGA single event effects heavy ions irradiation |
| ISSN号 | 1349-2543 |
| DOI | 10.1587/elex.16.20190196 |
| 通讯作者 | Cai, Chang(caichang@impcas.ac.cn) |
| 英文摘要 | A flexible and multipurpose Single Event Effects (SEEs) testing system was developed for evaluating the reliability of nanoscale Very Large Scale Integrated Circuit (VLSI). The accurate detection, comparation and classification of latch-up, upset, and functional interrupt were achieved. In host PC part, two customized software systems were developed, including the Procise for maximal resources occupation and a C-# based visual control interface for real-time communication. For hardware, a motherboard-daughterboard system guaranteed testing performance and kept its compatibility throughout testing. The fault injection and Ta-181(31+) irradiation results indicated the validity of proposed measurements and the stability of hardware operation. Importantly, the high anti-irradiation performance of device was also verified. |
| WOS关键词 | MITIGATION ; ROBUST |
| 资助项目 | National Natural Science Foundation of China[11805244] ; National Natural Science Foundation of China[11690041] ; National Natural Science Foundation of China[11675233] |
| WOS研究方向 | Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000470698800009 |
| 出版者 | IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG |
| 资助机构 | National Natural Science Foundation of China |
| 源URL | [http://119.78.100.186/handle/113462/133293]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Cai, Chang |
| 作者单位 | 1.Fudan Univ, State Key Lab ASIC & Syst, Shanghai 201203, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Gansu, Peoples R China 3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China |
| 推荐引用方式 GB/T 7714 | Xu, Liewei,Cai, Chang,Liu, Tianqi,et al. Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits[J]. IEICE ELECTRONICS EXPRESS,2019,16(10):6. |
| APA | Xu, Liewei,Cai, Chang,Liu, Tianqi,Ke, Lingyun,Yu, Jun,&Wu, Chang.(2019).Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits.IEICE ELECTRONICS EXPRESS,16(10),6. |
| MLA | Xu, Liewei,et al."Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits".IEICE ELECTRONICS EXPRESS 16.10(2019):6. |
入库方式： OAI收割
来源：近代物理研究所
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