Strong electronic excitation effect of swift heavy ions on C-60 films
文献类型:期刊论文
作者 | Tian, HX; Yao, CF; Zhu, ZY; Sun, YM; Zhang, CH; Wang, ZG; Xie, EQ; Liu, J; Jin, YF |
刊名 | HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
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出版日期 | 2004-07-01 |
卷号 | 28期号:3页码:781-785 |
关键词 | strong electronic excitation effect swift heavy ion C-60 film annealing effect |
ISSN号 | 0254-3052 |
英文摘要 | Strong electronic excitation effect of C-60 films induced by 2.0 GeV Xe-136 and 2.7GeV U-238 ions was investigated by means of Fourier transform infrared (FTIR), Raman Scattering and X-ray diffraction (XRD) spectroscopies. A new peak located at 670 cm(-1), which corresponds to an unknown structure, was observed in the FTIR spectra of C-60 films irradiated for the first time. The variation in intensity of 670 cm-1 peak with electronic energy loss and irradiation dose were studied. The analysis results indicated that electronic energy transfer dominates the damage process of C-60 films. The partial recovery of the damage in irradiated C-60 films at middle electronic energy loss is attributed to an annealing effect of the strong electronic excitation. The ion velocity also plays a role in the process of the damage creation. |
WOS关键词 | FULLERENE FILMS ; HIGH-ENERGY ; DAMAGE ; POLYMERIZATION ; IRRADIATION ; METALS |
WOS研究方向 | Physics |
语种 | 英语 |
WOS记录号 | WOS:000222817300020 |
出版者 | SCIENCE CHINA PRESS |
公开日期 | 2010-10-29 |
源URL | [http://ir.imp.cas.cn/handle/113462/1683] ![]() |
专题 | 近代物理研究所_近代物理研究所知识存储(2010之前) |
通讯作者 | Jin, YF |
作者单位 | 1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 2.Lanzhou Univ, Sch Phys Sci & Technol, Lanzhou 730000, Peoples R China |
推荐引用方式 GB/T 7714 | Tian, HX,Yao, CF,Zhu, ZY,et al. Strong electronic excitation effect of swift heavy ions on C-60 films[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2004,28(3):781-785. |
APA | Tian, HX.,Yao, CF.,Zhu, ZY.,Sun, YM.,Zhang, CH.,...&Jin, YF.(2004).Strong electronic excitation effect of swift heavy ions on C-60 films.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,28(3),781-785. |
MLA | Tian, HX,et al."Strong electronic excitation effect of swift heavy ions on C-60 films".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 28.3(2004):781-785. |
入库方式: OAI收割
来源:近代物理研究所
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