Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions
文献类型:期刊论文
作者 | Wang, Yuyu1![]() ![]() ![]() |
刊名 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
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出版日期 | 2007-12-01 |
卷号 | 265期号:2页码:474-478 |
关键词 | highly charged ions electron emission |
ISSN号 | 0168-583X |
DOI | 10.1016/j.nimb.2007.09.047 |
英文摘要 | T he total secondary electron emission yields, gamma(T), induced by impact of the fast ions Neq+ (q = 2-8) and Arq+ (q = 3-12) on Si and Neq+ (q = 2-8) on W targets have been measured. It was observed that for a given impact energy, gamma(T) increases with the charge of projectile ion. By plotting gamma(T) as a function of the total potential energy of the respective ion, true kinetic and potential electron yields have been obtained. Potential electron yield was proportional to the total potential energy of the projectile ion. However, decrease in potential electron yield with increasing kinetic energy of Neq+ impact on Si and W was observed. This decrease in potential electron yield with kinetic energy of the ion was more pronounced for the projectile ions having higher charge states. Moreover, kinetic electron yield to energy-loss ratio for various ion-target combinations was calculated and results were in good agreement with semi-empirical model for kinetic electron emission. (C) 2007 Elsevier B.V. All rights reserved. |
WOS关键词 | CLEAN METAL-SURFACE ; SLOW HOLLOW ATOMS ; STOPPING POWER ; IMPACT ; YIELDS ; PROBE |
WOS研究方向 | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics |
语种 | 英语 |
WOS记录号 | WOS:000252001800004 |
出版者 | ELSEVIER SCIENCE BV |
公开日期 | 2010-10-29 |
源URL | [http://ir.imp.cas.cn/handle/113462/5831] ![]() |
专题 | 近代物理研究所_近代物理研究所知识存储(2010之前) 近代物理研究所_实验物理中心 近代物理研究所_兰州重离子研究装置 |
通讯作者 | Qayyum, A. |
作者单位 | 1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 2.Pakistan Inst Nucl Sci & Technol, Div Phys, Islamabad, Pakistan |
推荐引用方式 GB/T 7714 | Wang, Yuyu,Zhao, Yongtao,Qayyum, A.,et al. Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2007,265(2):474-478. |
APA | Wang, Yuyu,Zhao, Yongtao,Qayyum, A.,&Xiao, Guoqing.(2007).Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,265(2),474-478. |
MLA | Wang, Yuyu,et al."Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 265.2(2007):474-478. |
入库方式: OAI收割
来源:近代物理研究所
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