中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Study on nanohardness of helium-implanted 4H-SiC

文献类型:期刊论文

作者Yang Yi-Tao1,2; Zhou Li-Hong1,2; Zhang Chong-Hong1; Zhang Yong1,2; Li Bing-Sheng1,2
刊名ACTA PHYSICA SINICA
出版日期2010-06-01
卷号59期号:6页码:4130-4135
关键词silicon carbide implantation lie bubbles nano-indentation
ISSN号1000-3290
英文摘要The hardness of 4H-SiC, which was high-temperature (500 K) helium-Implanted to fluences of 3 x 10(16) Ions cm(-2) and subsequently thermally annealed at the temperature ranging from 773 to 1273 K, was studied by nanoindentation It is found that the hardness of the implanted 4H-SiC increases at the first, then decreases, and then increases again with increasing annealing tempeature in the temperature range of 500-1273 K, and significant increase in hardness is observed at 773 K. The behavior is ascribed to the changes of the density, length, and tangling of the covalent Si-C bond through the recombination of point defects, clustering of He-vacancy, and growth of helium bubbles during the thermal annealing
WOS关键词ELECTRON-SPIN-RESONANCE ; SILICON-CARBIDE ; MECHANICAL-PROPERTIES ; CAVITIES ; RELEASE
资助项目National Natural Science Foundation of China[10575124]
WOS研究方向Physics
语种英语
WOS记录号WOS:000278672300074
出版者CHINESE PHYSICAL SOC
资助机构National Natural Science Foundation of China
公开日期2011-04-20
源URL[http://ir.imp.cas.cn/handle/113462/7697]  
专题近代物理研究所_近代物理研究所知识存储(2010之前)
近代物理研究所_材料研究中心
近代物理研究所_先进核能材料研究室(ADS)
通讯作者Zhang Chong-Hong
作者单位1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
2.Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714
Yang Yi-Tao,Zhou Li-Hong,Zhang Chong-Hong,et al. Study on nanohardness of helium-implanted 4H-SiC[J]. ACTA PHYSICA SINICA,2010,59(6):4130-4135.
APA Yang Yi-Tao,Zhou Li-Hong,Zhang Chong-Hong,Zhang Yong,&Li Bing-Sheng.(2010).Study on nanohardness of helium-implanted 4H-SiC.ACTA PHYSICA SINICA,59(6),4130-4135.
MLA Yang Yi-Tao,et al."Study on nanohardness of helium-implanted 4H-SiC".ACTA PHYSICA SINICA 59.6(2010):4130-4135.

入库方式: OAI收割

来源:近代物理研究所

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