NEW TOOLS FOR THE IMPROVEMENT OF BEAM BRIGHTNESS IN ECR ION SOURCES
文献类型：会议论文
| 作者 | S. Gammino ; L. Celona ; D. Mascali ; G. Ciavola1 |
| 出版日期 | 2010-09-10 |
| 会议日期 | 2010-09-06 |
| 会议地点 | 兰州 |
| 英文摘要 | According to the model that has driven the development of ECRIS in the last years, a large variation of the pumping microwave frequency (order of GHz) along with the proportional increase of the magnetic field boosts the extracted current for each charge state because of a larger plasma density. Recent experiments have demonstrated that even slight frequency’s changes (of the order of MHz) considerably influence the output current, and what’s more important, even the extracted beam properties (beam shape, brightness and emittance) are affected. A number of tests have been carried out in the last few years and they will be reviewed along with the results of numerical simulations which are able to explain the observed phenomena. The frequency has been systematically changed and the beam output has been recorded either in terms of charge state distributions and beam emittance. The detected bremsstrahlung X-rays are additionally analysed: they give insights about the electron energy distribution function (EEDF). An overview about the possible future improvements of ECR ion source will be given. |
| 资助机构 | IMP;Chinese Academy of Sciences |
| 会议录 | The 19th International Conference on Cyclotrons and their Applications, CYCLOTRONS'60
 |
| 语种 | 英语 |
| URL标识 | 查看原文 |
| 源URL | [http://ir.imp.cas.cn/handle/113462/8619]  |
| 专题 | 近代物理研究所_近代物理研究所知识存储（2010之前） |
| 推荐引用方式 GB/T 7714 | S. Gammino,L. Celona,D. Mascali,et al. NEW TOOLS FOR THE IMPROVEMENT OF BEAM BRIGHTNESS IN ECR ION SOURCES[C]. 见:. 兰州. 2010-09-06. |
入库方式： OAI收割
来源：近代物理研究所
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