Defect production and annealing induced by electronic energy loss inpure metal
文献类型：期刊论文
| 作者 | Wang ; ZGDufour ; CHou ; MDJin ; GMJin ; YFPaumier ; EToulemonde |
| 刊名 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM
 |
| 出版日期 | 1998 |
| 卷号 | 135期号:1-4页码:265-269 |
| 关键词 | Electronic Energy Loss Thermal Spike Vacancy And Interstitial |
| ISSN号 | 0168-583X |
| 通讯作者 | Wang, ZG, Chinese Acad Sci, Inst Modern Phys, POB 31, Lanzhou 730000, |
| 语种 | 英语 |
| 公开日期 | 2011-08-26 |
| 源URL | [http://ir.imp.cas.cn/handle/113462/10407]  |
| 专题 | 近代物理研究所_近代物理研究所知识存储（2010之前） |
| 推荐引用方式 GB/T 7714 | Wang,ZGDufour,CHou,et al. Defect production and annealing induced by electronic energy loss inpure metal[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM,1998,135(1-4):265-269. |
| APA | Wang.,ZGDufour.,CHou.,MDJin.,GMJin.,...&EToulemonde.(1998).Defect production and annealing induced by electronic energy loss inpure metal.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM,135(1-4),265-269. |
| MLA | Wang,et al."Defect production and annealing induced by electronic energy loss inpure metal".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM 135.1-4(1998):265-269. |
入库方式： OAI收割
来源：近代物理研究所
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