中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Study of channeling effect by impact of highly charged ions on crystal surface of Si(110)

文献类型:期刊论文

作者Han Yun-Cheng2; Wang Tie-Shan2; Peng Hai-Bo2; Wang Yu-Yu1; Zhao Yong-Tao1; Cheng Rui2; Xu He2; Ding Da-Jie2
刊名ACTA PHYSICA SINICA
出版日期2008-04-01
卷号57页码:2161-2164
关键词highly charged ions sputtering channeling effect
ISSN号1000-3290
英文摘要The (110) crystal surface of Si was bombarded by slow highly charged ions (Pbq+, Arq+) and the secondary particle emission was measured for different incident angles. Comparing the relationship between the sputtering yield and the incident angle, channeling effect was suggested. The channeling effect in interaction of highly charged ions with Si causes the sputtering yield to depend strongly on kinetic energy. Highly charged ions can enhance sputtering yield at smaller incident angles. At incident angles from 40 degrees to 50 degrees, the higher the potential energy of highly charged ion, the greater the sputtering yield.
WOS关键词SOLID-SURFACE ; SLOW ; ENERGY ; TRAP
WOS研究方向Physics
语种英语
WOS记录号WOS:000255087200027
出版者CHINESE PHYSICAL SOC
源URL[http://119.78.100.186/handle/113462/29704]  
专题近代物理研究所_实验物理中心
通讯作者Peng Hai-Bo
作者单位1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
2.Lanzhou Univ, Inst Nucl Sci & Technol, Lanzhou 730000, Peoples R China
推荐引用方式
GB/T 7714
Han Yun-Cheng,Wang Tie-Shan,Peng Hai-Bo,et al. Study of channeling effect by impact of highly charged ions on crystal surface of Si(110)[J]. ACTA PHYSICA SINICA,2008,57:2161-2164.
APA Han Yun-Cheng.,Wang Tie-Shan.,Peng Hai-Bo.,Wang Yu-Yu.,Zhao Yong-Tao.,...&Ding Da-Jie.(2008).Study of channeling effect by impact of highly charged ions on crystal surface of Si(110).ACTA PHYSICA SINICA,57,2161-2164.
MLA Han Yun-Cheng,et al."Study of channeling effect by impact of highly charged ions on crystal surface of Si(110)".ACTA PHYSICA SINICA 57(2008):2161-2164.

入库方式: OAI收割

来源:近代物理研究所

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