Dynamics of slow electrons transmitting through straight glass capillary and tapered glass capillary
文献类型：期刊论文
| 作者 | Schuch, Reinhold2; Cui Ying4; Shao Jian-Xiong4; Yang Zhi-Hu1 ; Chen Xi-Meng4; Zhang Hong-Qiang4; Song Zhang-Yong1; Zhang Qi4; Zhou Li-Hua4; Gao Zhi-Min3
|
| 刊名 | ACTA PHYSICA SINICA
 |
| 出版日期 | 2016-10-20 |
| 卷号 | 65页码:8 |
| 关键词 | low energy electron the full angular distribution of the transmitted electrons glass capillaries highly charged ions |
| ISSN号 | 1000-3290 |
| DOI | 10.7498/aps.65.204103 |
| 英文摘要 | It has been found that the transmission rate of the electrons through insulating capillaries as a function of time/incident charge is not the same as that of the ions. The question arises that by using the electrons, if the negative charge patches can be formed to facilitate the transmission of the following electrons, thereby substantiating that the so-called guiding effect works also for electrons. This study aims to observe the time evolutions of the transmission of electrons through a straight glass tube and a tapered glass capillary. This will reveal the details of how and (or) if the negative charge patches can be formed when the electrons transport through them. In this work, a set of MCP/phosphor two-dimensional detection system based on Labview platform is developed to obtain the time evolution of the angular distribution of the transmitted electrons. The pulsed electron beams are obtained to test our detection system. The time evolution of the angular profile of 1.5 keV electrons transmitting through the glass tube/capillary is observed. The transmitted electrons are observed on the detector for a very short time and disappear for a time and then appear again for both the glass tube and tapered glass capillary, leading to an oscillation. The positive charge patches are formed in the insulating glass tube and tapered glass capillary since the secondary electron emission coefficient for the incident energy is larger than 1. It is due to the fact that fast discharge of the deposited charge leads to the increase of the transmission rate, while the fast blocking of the incident electrons due to the deposited positive charge leads to the decrease of the transmission rate. The geometrical configuration of the taper glass capillary tends to make the secondary electrons deposited at the exit part to form the negative patches that facilitate the transmission of electrons. This suggests that if the stable transmission needs to be reached for producing the electron micro-beam by using tapered glass capillaries, the steps must be taken to have the proper grounding and shielding of the glass capillaries and tubes. Our results show a difference in transmission through the insulating capillary between electrons and highly charged ions. |
| 资助项目 | National Natural Science Foundation of China[11475075] ; National Natural Science Foundation of China[11104125] |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000389465700008 |
| 出版者 | CHINESE PHYSICAL SOC |
| 资助机构 | National Natural Science Foundation of China |
| 源URL | [http://119.78.100.186/handle/113462/43856]  |
| 专题 | 近代物理研究所_实验物理中心 |
| 通讯作者 | Chen Xi-Meng; Zhang Hong-Qiang |
| 作者单位 | 1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 2.Stockholm Univ, Dept Phys, S-10691 Stockholm, Sweden 3.Nucl & Radiat Safety Bur Gansu Prov, Lanzhou 730000, Peoples R China 4.Lanzhou Univ, Sch Nucl Sci & Technol, Lanzhou 730000, Peoples R China |
| 推荐引用方式 GB/T 7714 | Schuch, Reinhold,Cui Ying,Shao Jian-Xiong,et al. Dynamics of slow electrons transmitting through straight glass capillary and tapered glass capillary[J]. ACTA PHYSICA SINICA,2016,65:8. |
| APA | Schuch, Reinhold.,Cui Ying.,Shao Jian-Xiong.,Yang Zhi-Hu.,Chen Xi-Meng.,...&Wan Cheng-Liang.(2016).Dynamics of slow electrons transmitting through straight glass capillary and tapered glass capillary.ACTA PHYSICA SINICA,65,8. |
| MLA | Schuch, Reinhold,et al."Dynamics of slow electrons transmitting through straight glass capillary and tapered glass capillary".ACTA PHYSICA SINICA 65(2016):8. |
入库方式： OAI收割
来源：近代物理研究所
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