Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions
文献类型:期刊论文
作者 | Ren, Jieru1,4; Wang, Xing1,4; Cheng, Rui3![]() ![]() ![]() ![]() |
刊名 | SCIENTIFIC REPORTS
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出版日期 | 2017-07-25 |
卷号 | 7页码:6 |
ISSN号 | 2045-2322 |
DOI | 10.1038/s41598-017-06891-9 |
英文摘要 | Secondary electron emission yield from the surface of SiC ceramics induced by Xe17+ ions has been measured as a function of target temperature and incident energy. In the temperature range of 463-659 K, the total yield gradually decreases with increasing target temperature. The decrease is about 57% for 3.2 MeV Xe17+ impact, and about 62% for 4.0 MeV Xe17+ impact, which is much larger than the decrease observed previously for ion impact at low charged states. The yield dependence on the temperature is discussed in terms of work function, because both kinetic electron emission and potential electron emission are influenced by work function. In addition, our experimental data show that the total electron yield gradually increases with the kinetic energy of projectile, when the target is at a constant temperature higher than room temperature. This result can be explained by electronic stopping power which plays an important role in kinetic electron emission. |
WOS关键词 | HIGHLY-CHARGED IONS ; X-RAY-EMISSION ; HEAVY-IONS ; SURFACE ; SLOW ; IONIZATION ; DEPENDENCE ; YIELD ; ATOMS ; FIELD |
资助项目 | National Natural Science Foundation of China[11375138] ; National Natural Science Foundation of China[11605147] ; National Natural Science Foundation of China[11505248] ; National Natural Science Foundation of China[11075125] ; Specialized Research Fund for the Doctoral Program of Higher Education[20130201110066] ; Scientific Research Program - Shaanxi Provincial Education Department[16JK1824] |
WOS研究方向 | Science & Technology - Other Topics |
语种 | 英语 |
WOS记录号 | WOS:000406282200010 |
出版者 | NATURE PUBLISHING GROUP |
资助机构 | National Natural Science Foundation of China ; Specialized Research Fund for the Doctoral Program of Higher Education ; Scientific Research Program - Shaanxi Provincial Education Department |
源URL | [http://119.78.100.186/handle/113462/45382] ![]() |
专题 | 近代物理研究所_实验物理中心 |
通讯作者 | Xu, Zhongfeng |
作者单位 | 1.Xi An Jiao Tong Univ, Sch Sci, Xian 710049, Shaanxi, Peoples R China 2.Xianyang Normal Univ, Ion Beam & Opt Phys Lab, Xianyang 712000, Peoples R China 3.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Gansu, Peoples R China 4.Xi An Jiao Tong Univ, Inst Sci & Technol Laser & Particle Beams, Xian 710049, Shaanxi, Peoples R China |
推荐引用方式 GB/T 7714 | Ren, Jieru,Wang, Xing,Cheng, Rui,et al. Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions[J]. SCIENTIFIC REPORTS,2017,7:6. |
APA | Ren, Jieru.,Wang, Xing.,Cheng, Rui.,Zhou, Xianming.,Zeng, Lixia.,...&Lei, Yu.(2017).Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions.SCIENTIFIC REPORTS,7,6. |
MLA | Ren, Jieru,et al."Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions".SCIENTIFIC REPORTS 7(2017):6. |
入库方式: OAI收割
来源:近代物理研究所
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