中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions

文献类型:期刊论文

作者Ren, Jieru1,4; Wang, Xing1,4; Cheng, Rui3; Zhou, Xianming3; Zeng, Lixia1,2,4; Xu, Zhongfeng1,3,4; Zhang, Xiaoan2,3; Zhao, Yongtao1,3,4; Ma, Lidong3; Lei, Yu3
刊名SCIENTIFIC REPORTS
出版日期2017-07-25
卷号7页码:6
ISSN号2045-2322
DOI10.1038/s41598-017-06891-9
英文摘要Secondary electron emission yield from the surface of SiC ceramics induced by Xe17+ ions has been measured as a function of target temperature and incident energy. In the temperature range of 463-659 K, the total yield gradually decreases with increasing target temperature. The decrease is about 57% for 3.2 MeV Xe17+ impact, and about 62% for 4.0 MeV Xe17+ impact, which is much larger than the decrease observed previously for ion impact at low charged states. The yield dependence on the temperature is discussed in terms of work function, because both kinetic electron emission and potential electron emission are influenced by work function. In addition, our experimental data show that the total electron yield gradually increases with the kinetic energy of projectile, when the target is at a constant temperature higher than room temperature. This result can be explained by electronic stopping power which plays an important role in kinetic electron emission.
WOS关键词HIGHLY-CHARGED IONS ; X-RAY-EMISSION ; HEAVY-IONS ; SURFACE ; SLOW ; IONIZATION ; DEPENDENCE ; YIELD ; ATOMS ; FIELD
资助项目National Natural Science Foundation of China[11375138] ; National Natural Science Foundation of China[11605147] ; National Natural Science Foundation of China[11505248] ; National Natural Science Foundation of China[11075125] ; Specialized Research Fund for the Doctoral Program of Higher Education[20130201110066] ; Scientific Research Program - Shaanxi Provincial Education Department[16JK1824]
WOS研究方向Science & Technology - Other Topics
语种英语
WOS记录号WOS:000406282200010
出版者NATURE PUBLISHING GROUP
资助机构National Natural Science Foundation of China ; Specialized Research Fund for the Doctoral Program of Higher Education ; Scientific Research Program - Shaanxi Provincial Education Department
源URL[http://119.78.100.186/handle/113462/45382]  
专题近代物理研究所_实验物理中心
通讯作者Xu, Zhongfeng
作者单位1.Xi An Jiao Tong Univ, Sch Sci, Xian 710049, Shaanxi, Peoples R China
2.Xianyang Normal Univ, Ion Beam & Opt Phys Lab, Xianyang 712000, Peoples R China
3.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Gansu, Peoples R China
4.Xi An Jiao Tong Univ, Inst Sci & Technol Laser & Particle Beams, Xian 710049, Shaanxi, Peoples R China
推荐引用方式
GB/T 7714
Ren, Jieru,Wang, Xing,Cheng, Rui,et al. Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions[J]. SCIENTIFIC REPORTS,2017,7:6.
APA Ren, Jieru.,Wang, Xing.,Cheng, Rui.,Zhou, Xianming.,Zeng, Lixia.,...&Lei, Yu.(2017).Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions.SCIENTIFIC REPORTS,7,6.
MLA Ren, Jieru,et al."Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions".SCIENTIFIC REPORTS 7(2017):6.

入库方式: OAI收割

来源:近代物理研究所

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