中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Electron emission and surface etching by slow and medium highly charged ions on HOPG surface

文献类型:会议论文

作者Xiao, Guoqing1; Wang, Xing1; Lei, Yu1; Zhou, Xianming1; Yu, Yang1,2; Ren, Jieru1,2; Cheng, Rui1; Zhao, Yongtao1; Sun, Jianrong1; Wang, Yuyu1
出版日期2013-12-15
关键词Highly charged ions Electron emission Surface nanostructuring HOPG
卷号317
DOI10.1016/j.nimb.2013.04.024
页码33-36
英文摘要Highly charged (Xe-129(q+), q = 10-30) ion-induced secondary electron emission and formation of nanostructure on the surface of highly oriented pyrolytic graphite (HOPG) have been studied on the 320 kV ECR platform for Highly Charged Ion Beam at IMP-CAS, Lanzhou. The experimental data of the total secondary electron yields are used to separate contributions of kinetic and potential electron yields. The estimated kinetic electron yields are about 17 and 35 electron/ion by ions with kinetic energies of 600 keV and 5 MeV, respectively. The potential electron yield increases linearly with increasing potential energy of the incident ion. The total electron yield, however, does not depend significantly on kinetic energy. AFM analysis of the HOPG surface bombarded with Xe30+ ions revealed regular hillock like nanostructure. The relationship between hillock size (height and width) and ion's energy (including potential energy and kinetic energy) shows the same trend with the total electron yield which increases with potential energy and is independent on incident kinetic energy. (C) 2013 Elsevier B.V. All rights reserved.
会议录NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
会议录出版者ELSEVIER SCIENCE BV
会议录出版地PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
语种英语
WOS研究方向Instruments & Instrumentation ; Nuclear Science & Technology ; Physics
WOS记录号WOS:000329378100007
源URL[http://119.78.100.186/handle/113462/57683]  
专题近代物理研究所_实验物理中心
近代物理研究所_先进核能材料研究室(ADS)
近代物理研究所_兰州重离子研究装置
通讯作者Wang, Yuyu
作者单位1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714
Xiao, Guoqing,Wang, Xing,Lei, Yu,et al. Electron emission and surface etching by slow and medium highly charged ions on HOPG surface[C]. 见:.

入库方式: OAI收割

来源:近代物理研究所

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