A flexible and robust soft-error testing system for microelectronic devices and integrated circuits
文献类型：期刊论文
| 作者 | Gu Song1,2 ; Su Hong1; Liu Jie1; Zhang Zhan-Gang1,2; Tong Teng1,2; Liu Tian-Qi1,2; Kong Jie1; Zhao Xing-Wen1,2; Yang Zhen-Lei1,2; Wang Xiao-Hui1,2
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| 刊名 | NUCLEAR SCIENCE AND TECHNIQUES
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| 出版日期 | 2015-06-01 |
| 卷号 | 26页码:7 |
| 关键词 | SEE testing Testing system Single Event Effects Soft errors HIRFL |
| ISSN号 | 1001-8042 |
| 英文摘要 | Single event effects (SEEs) induced by radiations become a significant reliability challenge for modern electronic systems. To evaluate SEEs susceptibility for microelectronic devices and integrated circuits (ICs), an SEE testing system with flexibility and robustness was developed at Heavy Ion Research Facility in Lanzhou (HIRFL). The system is compatible with various types of microelectronic devices and ICs, and supports plenty of complex and high-speed test schemes and plans for the irradiated devices under test (DUTs). Thanks to the combination of meticulous circuit design and the hardened logic design, the system has additional performances to avoid an overheated situation and irradiations by stray radiations. The system has been tested and verified by experiments for irradiating devices at HIRFL. |
| WOS关键词 | TEST GUIDELINE ; PROTON ; ENVIRONMENTS ; PLATFORM ; SIGNALS ; ICS |
| 资助项目 | National Natural Science Foundation of China[11079045] ; National Natural Science Foundation of China[11179003] ; National Natural Science Foundation of China[11305233] ; Important Direction Project of the CAS Knowledge Innovation Program[KJCX2-YW-N27] |
| WOS研究方向 | Nuclear Science & Technology ; Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000358109700012 |
| 出版者 | ELSEVIER SCIENCE BV |
| 资助机构 | National Natural Science Foundation of China ; Important Direction Project of the CAS Knowledge Innovation Program |
| 源URL | [http://119.78.100.186/handle/113462/40252]  |
| 专题 | 近代物理研究所_材料研究中心 近代物理研究所_科学仪器中心 |
| 通讯作者 | Su Hong |
| 作者单位 | 1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China |
| 推荐引用方式 GB/T 7714 | Gu Song,Su Hong,Liu Jie,et al. A flexible and robust soft-error testing system for microelectronic devices and integrated circuits[J]. NUCLEAR SCIENCE AND TECHNIQUES,2015,26:7. |
| APA | Gu Song.,Su Hong.,Liu Jie.,Zhang Zhan-Gang.,Tong Teng.,...&Wang Xiao-Hui.(2015).A flexible and robust soft-error testing system for microelectronic devices and integrated circuits.NUCLEAR SCIENCE AND TECHNIQUES,26,7. |
| MLA | Gu Song,et al."A flexible and robust soft-error testing system for microelectronic devices and integrated circuits".NUCLEAR SCIENCE AND TECHNIQUES 26(2015):7. |
入库方式： OAI收割
来源：近代物理研究所
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