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Experimental study on heavy ion single-event effects in flash-based FPGAs

文献类型：期刊论文

作者Liu, Tian-Qi1; Yang, Zhen-Lei1,2; Liu, Jie1; Wang, Xiao-Hui1; Su, Hong1; She, Qian-Shun1; Gu, Song1,2; Wang, Bin1,2; Xi, Kai1,2
刊名NUCLEAR SCIENCE AND TECHNIQUES
出版日期2016-02-01
卷号27页码:8
关键词Single-event effects (SEEs) Flash-based FPGAs HIRFL Heavy ion experiments
ISSN号1001-8042
DOI10.1007/s41365-016-0015-8
英文摘要With extensive use of flash-based field-programmable gate arrays (FPGAs) in military and aerospace applications, single-event effects (SEEs) of FPGAs induced by radiations have been a major concern. In this paper, we present SEE experimental study of a flash-based FPGA from Microsemi ProASIC3 product family. The relation between the cross section and different linear energy transfer (LET) values for the logic tiles and embedded RAM blocks is obtained. The results show that the sequential logic cross section depends not too much on operating frequency of the device. And the relationship between 0 -> 1 upsets (zeros) and 1 -> 0 upsets (ones) is different for different kinds of D-flip-flops. The devices are not sensitive to SEL up to a LET of 99.0 MeV cm(2)/mg. Post-beam tests show that the programming module is damaged due to the high-LET ions.
WOS关键词SRAMS
资助项目National Natural Science Foundation of China[11079045] ; National Natural Science Foundation of China[11179003] ; National Natural Science Foundation of China[11305233] ; HIRFL team
WOS研究方向Nuclear Science & Technology ; Physics
语种英语
WOS记录号WOS:000376332800017
出版者ELSEVIER SCIENCE BV
资助机构National Natural Science Foundation of China ; HIRFL team
源URL[http://119.78.100.186/handle/113462/42647]  
专题近代物理研究所_材料研究中心
通讯作者Su, Hong
作者单位1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714		 Liu, Tian-Qi,Yang, Zhen-Lei,Liu, Jie,et al. Experimental study on heavy ion single-event effects in flash-based FPGAs[J]. NUCLEAR SCIENCE AND TECHNIQUES,2016,27:8.
APA Liu, Tian-Qi.,Yang, Zhen-Lei.,Liu, Jie.,Wang, Xiao-Hui.,Su, Hong.,...&Xi, Kai.(2016).Experimental study on heavy ion single-event effects in flash-based FPGAs.NUCLEAR SCIENCE AND TECHNIQUES,27,8.
MLA Liu, Tian-Qi,et al."Experimental study on heavy ion single-event effects in flash-based FPGAs".NUCLEAR SCIENCE AND TECHNIQUES 27(2016):8.

入库方式： OAI收割

来源：近代物理研究所

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