Experimental study on heavy ion single-event effects in flash-based FPGAs (vol 27, 7, 2016)
文献类型:期刊论文
作者 | Su, Hong2![]() ![]() ![]() ![]() |
刊名 | NUCLEAR SCIENCE AND TECHNIQUES
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出版日期 | 2016-06-01 |
卷号 | 27页码:2 |
ISSN号 | 1001-8042 |
DOI | 10.1007/s41365-016-0052-3 |
WOS研究方向 | Nuclear Science & Technology ; Physics |
语种 | 英语 |
WOS记录号 | WOS:000380038900003 |
出版者 | SPRINGER SINGAPORE PTE LTD |
源URL | [http://119.78.100.186/handle/113462/43058] ![]() |
专题 | 近代物理研究所_材料研究中心 |
通讯作者 | Su, Hong |
作者单位 | 1.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China |
推荐引用方式 GB/T 7714 | Su, Hong,She, Qian-Shun,Wang, Xiao-Hui,et al. Experimental study on heavy ion single-event effects in flash-based FPGAs (vol 27, 7, 2016)[J]. NUCLEAR SCIENCE AND TECHNIQUES,2016,27:2. |
APA | Su, Hong.,She, Qian-Shun.,Wang, Xiao-Hui.,Liu, Jie.,Liu, Tian-Qi.,...&Gu, Song.(2016).Experimental study on heavy ion single-event effects in flash-based FPGAs (vol 27, 7, 2016).NUCLEAR SCIENCE AND TECHNIQUES,27,2. |
MLA | Su, Hong,et al."Experimental study on heavy ion single-event effects in flash-based FPGAs (vol 27, 7, 2016)".NUCLEAR SCIENCE AND TECHNIQUES 27(2016):2. |
入库方式: OAI收割
来源:近代物理研究所
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