中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Experimental study on heavy ion single-event effects in flash-based FPGAs (vol 27, 7, 2016)

文献类型:期刊论文

作者Su, Hong2; She, Qian-Shun2; Wang, Xiao-Hui2; Liu, Jie2; Liu, Tian-Qi2; Xi, Kai1,2; Wang, Bin1,2; Yang, Zhen-Lei1,2; Gu, Song1,2
刊名NUCLEAR SCIENCE AND TECHNIQUES
出版日期2016-06-01
卷号27页码:2
ISSN号1001-8042
DOI10.1007/s41365-016-0052-3
WOS研究方向Nuclear Science & Technology ; Physics
语种英语
WOS记录号WOS:000380038900003
出版者SPRINGER SINGAPORE PTE LTD
源URL[http://119.78.100.186/handle/113462/43058]  
专题近代物理研究所_材料研究中心
通讯作者Su, Hong
作者单位1.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
推荐引用方式
GB/T 7714
Su, Hong,She, Qian-Shun,Wang, Xiao-Hui,et al. Experimental study on heavy ion single-event effects in flash-based FPGAs (vol 27, 7, 2016)[J]. NUCLEAR SCIENCE AND TECHNIQUES,2016,27:2.
APA Su, Hong.,She, Qian-Shun.,Wang, Xiao-Hui.,Liu, Jie.,Liu, Tian-Qi.,...&Gu, Song.(2016).Experimental study on heavy ion single-event effects in flash-based FPGAs (vol 27, 7, 2016).NUCLEAR SCIENCE AND TECHNIQUES,27,2.
MLA Su, Hong,et al."Experimental study on heavy ion single-event effects in flash-based FPGAs (vol 27, 7, 2016)".NUCLEAR SCIENCE AND TECHNIQUES 27(2016):2.

入库方式: OAI收割

来源:近代物理研究所

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