Monte Carlo simulation based on Geant4 of single event upset induced by heavy ions
文献类型：期刊论文
| 作者 | Zhang ZhanGang1,2; Liu Jie2 ; Geng Chao1,2; Mo Dan2; Yao HuiJun2; Duan JingLai2; Gu Song1,2; Xi Kai1,2; Sun YouMei2; Hou MingDong2
|
| 刊名 | SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY
 |
| 出版日期 | 2013-06-01 |
| 卷号 | 56页码:1120-1125 |
| 关键词 | Seu Occurrence Sensitive Volume Critical Charge Deposited Energy Mufpsa |
| ISSN号 | 1674-7348 |
| DOI | 10.1007/s11433-013-5101-x |
| 文献子类 | Article |
| 英文摘要 | The present work is a computational simulation of single event upset (SEU) induced by heavy ions passing through the device with Geant4-tool based on Monte Carlo transport code. Key parameters affecting SEU occurrence are examined, and related geometrical construction and critical charge are quantified. The MUlti-Functional Package for SEU Analysis (MUFPSA) has been successfully programmed and applied for SEU occurrence after the completion of device geometrical construction, critical charge, and SEU cross section calculation. The proposed MUFPSA has yielded a good agreement with MRED. Specifically, the results show that higher LET incident ions lead to increased SEU vulnerability due to more diffusion and higher energy deposition. In addition, the analytical method of radial ionization profile provides a good complementary interpretation. |
| WOS关键词 | NUCLEAR-REACTIONS ; RATE PREDICTION ; ENERGY ; IMPACT |
| 资助项目 | National Natural Science Foundation of China[11179003] ; National Natural Science Foundation of China[10975164] ; National Natural Science Foundation of China[10805062] ; National Natural Science Foundation of China[11005134] |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000319072700013 |
| 出版者 | SCIENCE PRESS |
| 源URL | [http://119.78.100.186/handle/113462/48167]  |
| 专题 | 近代物理研究所_材料研究中心 |
| 通讯作者 | Liu Jie |
| 作者单位 | 1.Univ Chinese Acad Sci, Beijing 100190, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhang ZhanGang,Liu Jie,Geng Chao,et al. Monte Carlo simulation based on Geant4 of single event upset induced by heavy ions[J]. SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY,2013,56:1120-1125. |
| APA | Zhang ZhanGang.,Liu Jie.,Geng Chao.,Mo Dan.,Yao HuiJun.,...&Luo Jie.(2013).Monte Carlo simulation based on Geant4 of single event upset induced by heavy ions.SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY,56,1120-1125. |
| MLA | Zhang ZhanGang,et al."Monte Carlo simulation based on Geant4 of single event upset induced by heavy ions".SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY 56(2013):1120-1125. |
入库方式： OAI收割
来源：近代物理研究所
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