Modeling and assessing the influence of linear energy transfer on multiple bit upset susceptibility
文献类型：期刊论文
| 作者 | Gu Song1,2 ; Xi Kai1,2; Liu Jie2; Geng Chao1,2; Liu Tian-Qi1,2; Zhang Zhan-Gang1,2
|
| 刊名 | CHINESE PHYSICS B
 |
| 出版日期 | 2013-10-01 |
| 卷号 | 22 |
| 关键词 | Mufpsa Let Mbu Ion Track Structure |
| ISSN号 | 1674-1056 |
| DOI | 10.1088/1674-1056/22/10/109501 |
| 文献子类 | Article |
| 英文摘要 | The influence of the metric of linear energy transfer (LET) on single event upset (SEU), particularly multiple bit upset (MBU) in a hypothetical 90-nm static random access memory (SRAM) is explored. To explain the odd point of higher LET incident ion but induced lower cross section in the curve of SEU cross section, MBUs induced by incident ions Xe-132 and Bi-209 with the same LET but different energies at oblique incidence are investigated using multi-functional package for single event effect analysis (MUFPSA). In addition, a comprehensive analytical model of the radial track structure is incorporated into MUFPSA, which is a complementation for assessing and interpreting MBU susceptibility of SRAM. The results show that (i) with the increase of incident angle, MBU multiplicity and probability each present an increasing trend; (ii) due to the higher ion relative velocity and longer range of d electrons, higher energy ions trigger the MBU with less probability than lower energy ions. |
| WOS关键词 | SINGLE-EVENT UPSET ; HEAVY-ION ENERGY ; CROSS-SECTION ; SIMULATION ; GEANT4 ; CHARGE ; IMPACT ; SRAMS |
| 资助项目 | National Natural Science Foundation of China[11179003] ; National Natural Science Foundation of China[10975164] ; National Natural Science Foundation of China[10805062] ; National Natural Science Foundation of China[11005134] |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000326616700109 |
| 出版者 | IOP PUBLISHING LTD |
| 源URL | [http://119.78.100.186/handle/113462/48505]  |
| 专题 | 近代物理研究所_材料研究中心 |
| 通讯作者 | Liu Jie |
| 作者单位 | 1.Univ Chinese Acad Sci, Beijing 100190, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China |
| 推荐引用方式 GB/T 7714 | Gu Song,Xi Kai,Liu Jie,et al. Modeling and assessing the influence of linear energy transfer on multiple bit upset susceptibility[J]. CHINESE PHYSICS B,2013,22. |
| APA | Gu Song,Xi Kai,Liu Jie,Geng Chao,Liu Tian-Qi,&Zhang Zhan-Gang.(2013).Modeling and assessing the influence of linear energy transfer on multiple bit upset susceptibility.CHINESE PHYSICS B,22. |
| MLA | Gu Song,et al."Modeling and assessing the influence of linear energy transfer on multiple bit upset susceptibility".CHINESE PHYSICS B 22(2013). |
入库方式： OAI收割
来源：近代物理研究所
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