中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Modification of structure and optical band-gap of nc-Si:H films with ion irradiation

文献类型:会议论文

作者Wang, Zhiguang1; Wei, Kongfang1; Pang, Lilong1,2; Zhu, Huiping1,2; Wang, Ji1,2; Li, Yuanfei1,2; Cui, Minghuan1,2; Sheng, Yanbin1; Zhu, Yabin1,2; Sun, Jianrong1
出版日期2012-09
关键词nc-Si:H film Irradiation Structure Optical band-gap
卷号286
DOI10.1016/j.nimb.2012.02.035
页码308-312
英文摘要Hydrogenated nano-crystalline silicon (nc-Si:H) films fabricated by using hot-wire chemical vapor deposition are irradiated at room temperature with 6.0 MeV Xe-ions. The irradiation fluences are 1.0 x 10(13), 5.0 x 10(13) and 1.0 x 10(14) Xe-ions/cm(2). The structure and optical band-gap of the irradiated films varying with ion fluence are investigated by means of X-ray diffraction, Raman and UV-Vis-NIR spectroscopes, as well as transmission electron microscopy. It is found that the crystallite size, the crystalline fraction and the optical band-gap decrease continuously with increasing the ion fluence. The crystalline fraction of the films irradiated to the fluences from 0 to 1.0 x 10(14) Xe-ions/cm(2) decreases from about 65.7% to 2.9% and the optical band-gap decreases from about 2.1 to 1.6 eV. Possible origins of the modification of the nc-Si:H films under 6.0 MeV Xe-ions irradiation are briefly discussed. (C) 2012 Elsevier B.V. All rights reserved.
会议录NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
会议录出版者ELSEVIER SCIENCE BV
会议录出版地PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
语种英语
WOS研究方向Instruments & Instrumentation ; Nuclear Science & Technology ; Physics
WOS记录号WOS:000309488300060
源URL[http://119.78.100.186/handle/113462/57646]  
专题近代物理研究所_先进核能材料研究室(ADS)
通讯作者Wang, Zhiguang
作者单位1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
2.Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714
Wang, Zhiguang,Wei, Kongfang,Pang, Lilong,et al. Modification of structure and optical band-gap of nc-Si:H films with ion irradiation[C]. 见:.

入库方式: OAI收割

来源:近代物理研究所

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