Leakage Current Optimization Techniques During Test Based on Don t Care Bits Assignment
文献类型：期刊论文
| 作者 | Wei Wang(王伟); Xiao-Wei Li(李晓维); Yin-He Han(韩银和); Yu Hu(胡瑜); You-Sheng Zhang(张佑生) |
| 刊名 | Journal of Computer Science and Technology
 |
| 出版日期 | 2007 |
| 卷号 | 22期号:5页码:673-680 |
| 关键词 | Leakage Current Dont Care Bits Minimum Leakage Vector Leakage Power |
| 英文摘要 | It is a well-known fact that test power consumption may exceed that during functional operation. Leakage power dissipation caused by leakage current in Complementary Metal-Oxide-Semiconductor (CMOS) circuits during test has become a significant part of the total power dissipation. Hence, it is important to reduce leakage power to prolong battery life in portable systems which employ periodic self-test, to increase test reliability and to reduce test cost. This paper analyzes leakage current and presents a kind of leakage current simulator based on the transistor stacking effect. Using it, we propose techniques based on don't care bits (denoted by $X$s) in test vectors to optimize leakage current in integrated circuit (IC) test by genetic algorithm. The techniques identify a set of don't care inputs in given test vectors and reassign specified logic values to the $X$ inputs by the genetic algorithm to get minimum leakage vector (MLV). Experimental results indicate that the techniques can effectually optimize leakage current of combinational circuits and sequential circuits during test while maintaining high fault coverage. |
| 语种 | 英语 |
| 公开日期 | 2010-11-03 |
| 源URL | [http://ictir.ict.ac.cn/handle/311040/824]  |
| 专题 | 中国科学院计算技术研究所期刊论文_2007年英文 |
| 推荐引用方式 GB/T 7714 | Wei Wang,Xiao-Wei Li,Yin-He Han,et al. Leakage Current Optimization Techniques During Test Based on Don t Care Bits Assignment[J]. Journal of Computer Science and Technology,2007,22(5):673-680. |
| APA | Wei Wang,Xiao-Wei Li,Yin-He Han,Yu Hu,&You-Sheng Zhang.(2007).Leakage Current Optimization Techniques During Test Based on Don t Care Bits Assignment.Journal of Computer Science and Technology,22(5),673-680. |
| MLA | Wei Wang,et al."Leakage Current Optimization Techniques During Test Based on Don t Care Bits Assignment".Journal of Computer Science and Technology 22.5(2007):673-680. |
入库方式： OAI收割
来源：计算技术研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。