Atomic Scale Modulation of Self-Rectifying Resistive Switching by Interfacial Defects
文献类型:期刊论文
作者 | xing wu; kaihao yu; Dongkyu cha; Michel Bosman; Nagarajan Raghavan; xixiang zhang; KunLi; qiLiu; Litao Sun; Kinleong Pey |
刊名 | Advavced Science |
出版日期 | 2018-01-19 |
文献子类 | 期刊论文 |
源URL | [http://159.226.55.107/handle/172511/18936] |
专题 | 微电子研究所_微电子器件与集成技术重点实验室 |
推荐引用方式 GB/T 7714 | xing wu,kaihao yu,Dongkyu cha,et al. Atomic Scale Modulation of Self-Rectifying Resistive Switching by Interfacial Defects[J]. Advavced Science,2018. |
APA | xing wu.,kaihao yu.,Dongkyu cha.,Michel Bosman.,Nagarajan Raghavan.,...&Kinleong Pey.(2018).Atomic Scale Modulation of Self-Rectifying Resistive Switching by Interfacial Defects.Advavced Science. |
MLA | xing wu,et al."Atomic Scale Modulation of Self-Rectifying Resistive Switching by Interfacial Defects".Advavced Science (2018). |
入库方式: OAI收割
来源:微电子研究所
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