Unveiling the Switching Mechanism of a TaOx/HfO2Self-Selective Cell by Probing the Trap Profiles With RTN Measurements
文献类型：期刊论文
| 作者 | Gong TC(龚天成); Luo Q(罗庆); Lv HB(吕杭炳); Xu XX(许晓欣); Yu J(余杰); Liu Q(刘琦) |
| 刊名 | IEEE Electron Device Letters
 |
| 出版日期 | 2018-06-22 |
| 文献子类 | 期刊论文 |
| 源URL | [http://159.226.55.107/handle/172511/18947]  |
| 专题 | 微电子研究所_微电子器件与集成技术重点实验室 |
| 推荐引用方式 GB/T 7714 | Gong TC,Luo Q,Lv HB,et al. Unveiling the Switching Mechanism of a TaOx/HfO2Self-Selective Cell by Probing the Trap Profiles With RTN Measurements[J]. IEEE Electron Device Letters,2018. |
| APA | 龚天成,罗庆,吕杭炳,许晓欣,余杰,&刘琦.(2018).Unveiling the Switching Mechanism of a TaOx/HfO2Self-Selective Cell by Probing the Trap Profiles With RTN Measurements.IEEE Electron Device Letters. |
| MLA | 龚天成,et al."Unveiling the Switching Mechanism of a TaOx/HfO2Self-Selective Cell by Probing the Trap Profiles With RTN Measurements".IEEE Electron Device Letters (2018). |
入库方式： OAI收割
来源：微电子研究所
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