中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Investigation of chlorine-based etchants in wet and dry etching technology for InP planar Gunn diode

文献类型:期刊论文

作者Jia R(贾锐); Wu DQ(武德起); Bai Y(白阳)
刊名CHINESE PHYS B
出版日期2013-01-29
公开日期2014-10-27
源URL[http://10.10.10.126/handle/311049/11928]  
专题微电子研究所_高频高压器件与集成研发中心
通讯作者Jia R(贾锐)
推荐引用方式
GB/T 7714
Jia R,Wu DQ,Bai Y. Investigation of chlorine-based etchants in wet and dry etching technology for InP planar Gunn diode[J]. CHINESE PHYS B,2013.
APA 贾锐,武德起,&白阳.(2013).Investigation of chlorine-based etchants in wet and dry etching technology for InP planar Gunn diode.CHINESE PHYS B.
MLA 贾锐,et al."Investigation of chlorine-based etchants in wet and dry etching technology for InP planar Gunn diode".CHINESE PHYS B (2013).

入库方式: OAI收割

来源:微电子研究所

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