TECHNOLOGY LIFE CYCLE ANALYSIS MODELLING BASED ON PATENT DOCUMENTS
文献类型：会议论文
| 作者 | Jing Wang ; Xian Zhang(张娴)
|
| 出版日期 | 2011-07-20 |
| 会议名称 | the 4th international seville conference on future-oriented technology analysis(fta) |
| 会议日期 | 2011-05-12~2011-05-13 |
| 会议地点 | spain, seville |
| 关键词 | technology life cycle patent indicator cathode ray tube thin film transistor liquid crystal display nano-biosensor |
| 中文摘要 | to estimate the future development of one technology and make decisions whether to invest in it or not, one needs to know the stage status of its technology life cycle (tlc). the major approach to analysing tlc uses the s-curve to observe patent applications over time. but using the patent application counts alone to represent the development of technology oversimplifies the situation. in this paper, we build a model to calculate the tlc for an object technology based on multiple patent-related indicators. the model includes the following steps: first, we focus on devising and assessing patent-based tlc indicators. then we choose some technologies (training technologies) with identified life cycle stages, and finally compare the indicator features in training technologies with the indicator values in an object technology (test technology) by nearest neighbour classifier, which is widely used in pattern recognition, to measure the technology life cycle stages of the object technology. the method and result of this study can be used in management practice to enable technology observers to determine the current life cycle stage of a particular technology of interest. |
| 会议主办者 | european commissionjoint research centreinstitute for prospective technological studies |
| 会议录 | fta and grand societal challenges: shaping and driving structural and systemic transformations
 |
| 学科主题 | 情报研究理论与方法 |
| 语种 | 中文 |
| ISSN号 | 1831-9424 |
| ISBN号 | 978-92-79-20118-9 |
| 源URL | [http://ir.las.ac.cn/handle/12502/3823]  |
| 专题 | 文献情报中心_中国科学院成都文献情报中心_情报研究部 |
| 推荐引用方式 GB/T 7714 | Jing Wang,Xian Zhang. TECHNOLOGY LIFE CYCLE ANALYSIS MODELLING BASED ON PATENT DOCUMENTS[C]. 见:the 4th international seville conference on future-oriented technology analysis(fta). spain, seville. 2011-05-12~2011-05-13. |
入库方式： OAI收割
来源：文献情报中心
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