A high reliable high-k antifuse programmed by intrinsic overshoot current
文献类型：期刊论文
| 作者 | Zhong HC(钟汇才); Li X(李弦); Tian M(田敏); Li Li; Wang ZG(王志刚) |
| 刊名 | ECS Journal of Solid State Science and Technology
 |
| 出版日期 | 2018-04-13 |
| 文献子类 | 期刊论文 |
| 源URL | [http://159.226.55.107/handle/172511/19211]  |
| 专题 | 微电子研究所_集成电路先导工艺研发中心 |
| 推荐引用方式 GB/T 7714 | Zhong HC,Li X,Tian M,et al. A high reliable high-k antifuse programmed by intrinsic overshoot current[J]. ECS Journal of Solid State Science and Technology,2018. |
| APA | 钟汇才,李弦,田敏,Li Li,&王志刚.(2018).A high reliable high-k antifuse programmed by intrinsic overshoot current.ECS Journal of Solid State Science and Technology. |
| MLA | 钟汇才,et al."A high reliable high-k antifuse programmed by intrinsic overshoot current".ECS Journal of Solid State Science and Technology (2018). |
入库方式： OAI收割
来源：微电子研究所
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