中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Study of GaN epilayers growth on freestanding Si cantilevers

文献类型:期刊论文

作者Chen, J ; Wang, X ; Wu, AM ; Zhang, B ; Wang, X ; Wu, YX ; Zhu, JJ ; Yang, H杨辉
刊名SOLID-STATE ELECTRONICS
出版日期2010
卷号54期号:1页码:4-7
关键词FABRICATION SILICON MEMS NITRIDE
ISSN号0038-1101
通讯作者Chen, J, Chinese Acad Sci, State Key Lab Funct Mat Informat, Shanghai Inst Microsyst & Informat Technol, 865 Changning Rd, Shanghai 200050, Peoples R China
学科主题Engineering ; Electrical & Electronic; Physics ; Applied; Physics ; Condensed Matter
收录类别SCI
公开日期2011-11-04
源URL[http://ir.sim.ac.cn/handle/331004/12156]  
专题上海微系统与信息技术研究所_新能源技术_期刊论文
推荐引用方式
GB/T 7714
Chen, J,Wang, X,Wu, AM,et al. Study of GaN epilayers growth on freestanding Si cantilevers[J]. SOLID-STATE ELECTRONICS,2010,54(1):4-7.
APA Chen, J.,Wang, X.,Wu, AM.,Zhang, B.,Wang, X.,...&Yang, H杨辉.(2010).Study of GaN epilayers growth on freestanding Si cantilevers.SOLID-STATE ELECTRONICS,54(1),4-7.
MLA Chen, J,et al."Study of GaN epilayers growth on freestanding Si cantilevers".SOLID-STATE ELECTRONICS 54.1(2010):4-7.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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