中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Improvement in the Quality of ZnTe Epilayers Grown on GaAs Substrates by Introducing a Low-Temperature Buffer Layer

文献类型:期刊论文

作者Guo, QX ; Sueyasu, Y ; Tanaka, T ; Nishio, M ; Cao, JC
刊名JAPANESE JOURNAL OF APPLIED PHYSICS
出版日期2009-01-01
卷号48期号:8页码:80208-80208
关键词VAPOR-PHASE EPITAXY DRY-ETCHING PROCESSES P-TYPE ZNTE SURFACE-MORPHOLOGY OPTICAL-PROPERTIES ZINC TELLURIDE FABRICATION STRAIN
ISSN号0021-4922
通讯作者Guo, QX, Saga Univ, Synchrotron Light Applicat Ctr, Saga 8408502, Japan
学科主题Physics, Applied
收录类别SCI
语种英语
公开日期2011-11-03
源URL[http://ir.sim.ac.cn/handle/331004/11077]  
专题上海微系统与信息技术研究所_太赫兹、微波射频技术_期刊论文
推荐引用方式
GB/T 7714
Guo, QX,Sueyasu, Y,Tanaka, T,et al. Improvement in the Quality of ZnTe Epilayers Grown on GaAs Substrates by Introducing a Low-Temperature Buffer Layer[J]. JAPANESE JOURNAL OF APPLIED PHYSICS,2009,48(8):80208-80208.
APA Guo, QX,Sueyasu, Y,Tanaka, T,Nishio, M,&Cao, JC.(2009).Improvement in the Quality of ZnTe Epilayers Grown on GaAs Substrates by Introducing a Low-Temperature Buffer Layer.JAPANESE JOURNAL OF APPLIED PHYSICS,48(8),80208-80208.
MLA Guo, QX,et al."Improvement in the Quality of ZnTe Epilayers Grown on GaAs Substrates by Introducing a Low-Temperature Buffer Layer".JAPANESE JOURNAL OF APPLIED PHYSICS 48.8(2009):80208-80208.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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