中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
extractionofmaterialparametersofabilayerstructureusingterahertztimedomainspectroscopy

文献类型:期刊论文

作者Jin Biaobing1; Zhang Caihong1; Shen Xiaofang2; Ma Jinlong1; Chen Jian1; Shi Shengcai2; Wu Peiheng1
刊名sciencechinainformationscience
出版日期2014
卷号57期号:8页码:0
ISSN号1674-733X
英文摘要For a bi-layer structure consisting of a film deposited on a substrate,a new extraction method is proposed using which we can extract both the material parameters of the film and the thickness of the substrate from the measured Terahertz transmission through it,so long as the complex refractive index of the substrate is known beforehand.This method is applicable to a range of refractive indices of the film less than the refractive index of the substrate and a very wide range of layer thicknesses from 20μm to at least 200μm.It is very useful in some cases where the thickness of the substrate cannot be determined using conventional methods such as a Vernier caliper or micrometer screw.
语种英语
源URL[http://libir.pmo.ac.cn/handle/332002/28408]  
专题中国科学院紫金山天文台
作者单位1.南京大学
2.中国科学院紫金山天文台
推荐引用方式
GB/T 7714
Jin Biaobing,Zhang Caihong,Shen Xiaofang,et al. extractionofmaterialparametersofabilayerstructureusingterahertztimedomainspectroscopy[J]. sciencechinainformationscience,2014,57(8):0.
APA Jin Biaobing.,Zhang Caihong.,Shen Xiaofang.,Ma Jinlong.,Chen Jian.,...&Wu Peiheng.(2014).extractionofmaterialparametersofabilayerstructureusingterahertztimedomainspectroscopy.sciencechinainformationscience,57(8),0.
MLA Jin Biaobing,et al."extractionofmaterialparametersofabilayerstructureusingterahertztimedomainspectroscopy".sciencechinainformationscience 57.8(2014):0.

入库方式: OAI收割

来源:紫金山天文台

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