中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
The influence of the InGaN back-barrier on the properties of Al(0.3)Ga(0.7)N/AlN/GaN/InGaN/GaN structure

文献类型:期刊论文

作者Bi Y ; Wang XL ; Xiao HL ; Wang CM ; Peng EC ; Lin DF ; Feng C ; Jiang LJ
刊名european physical journal-applied physics
出版日期2011
卷号55期号:1页码:10102
关键词ALGAN/GAN/INGAN/GAN DH-HEMTS FIELD-EFFECT TRANSISTORS ALGAN/GAN POLARIZATION PASSIVATION HFETS GHZ
ISSN号1286-0042
通讯作者bi, y (reprint author), chinese acad sci, inst semicond, ctr mat sci, pob 912, beijing 100083, peoples r china, ybi@semi.ac.cn
学科主题半导体材料
收录类别SCI
资助信息knowledge innovation engineering of chinese academy of sciences[yyyj-0701-02]; national nature sciences foundation of china[60890193, 60906006]; state key development program for basic research of china[2006cb604905, 2010cb327503]; chinese academy of sciences[iscas2008t01, iscas2009l01, iscas2009l02]
语种英语
公开日期2012-01-06
源URL[http://ir.semi.ac.cn/handle/172111/22663]  
专题半导体研究所_半导体材料科学中心
推荐引用方式
GB/T 7714
Bi Y,Wang XL,Xiao HL,et al. The influence of the InGaN back-barrier on the properties of Al(0.3)Ga(0.7)N/AlN/GaN/InGaN/GaN structure[J]. european physical journal-applied physics,2011,55(1):10102.
APA Bi Y.,Wang XL.,Xiao HL.,Wang CM.,Peng EC.,...&Jiang LJ.(2011).The influence of the InGaN back-barrier on the properties of Al(0.3)Ga(0.7)N/AlN/GaN/InGaN/GaN structure.european physical journal-applied physics,55(1),10102.
MLA Bi Y,et al."The influence of the InGaN back-barrier on the properties of Al(0.3)Ga(0.7)N/AlN/GaN/InGaN/GaN structure".european physical journal-applied physics 55.1(2011):10102.

入库方式: OAI收割

来源:半导体研究所

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