中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Comprehensive thermal characterization using ruby R fluorescence lines of sapphire and GaNE(2)-high Raman mode from Raman spectra in high-power flip-chip InGaN/GaN LEDs

文献类型:期刊论文

作者Cui M ; Zhou TF ; Wang MR ; Huang J ; Huang HJ ; Zhang JP ; Xu K ; Yang H
刊名journal of physics d-applied physics
出版日期2011
卷号44期号:35页码:355101
关键词LIGHT-EMITTING-DIODES TEMPERATURE-MEASUREMENTS GAN SCATTERING DEPENDENCE JUNCTION PHONONS ALN
ISSN号0022-3727
通讯作者cui, m (reprint author), chinese acad sci, suzhou inst nanotech & nanobion, suzhou 215123, peoples r china, tfzhou2007@sinano.ac.cn ; kxu2006@sinano.ac.cn
学科主题半导体器件
收录类别SCI
资助信息national natural science foundation of china[50902099]; suzhou science and technology project[zxg0804]; cas[yz200939]
语种英语
公开日期2012-02-06
源URL[http://ir.semi.ac.cn/handle/172111/22771]  
专题半导体研究所_中科院半导体材料科学重点实验室
推荐引用方式
GB/T 7714
Cui M,Zhou TF,Wang MR,et al. Comprehensive thermal characterization using ruby R fluorescence lines of sapphire and GaNE(2)-high Raman mode from Raman spectra in high-power flip-chip InGaN/GaN LEDs[J]. journal of physics d-applied physics,2011,44(35):355101.
APA Cui M.,Zhou TF.,Wang MR.,Huang J.,Huang HJ.,...&Yang H.(2011).Comprehensive thermal characterization using ruby R fluorescence lines of sapphire and GaNE(2)-high Raman mode from Raman spectra in high-power flip-chip InGaN/GaN LEDs.journal of physics d-applied physics,44(35),355101.
MLA Cui M,et al."Comprehensive thermal characterization using ruby R fluorescence lines of sapphire and GaNE(2)-high Raman mode from Raman spectra in high-power flip-chip InGaN/GaN LEDs".journal of physics d-applied physics 44.35(2011):355101.

入库方式: OAI收割

来源:半导体研究所

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