中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Investigation on Silicon on Insulator Fabricated by Separation by Implanted Oxygen Layer Transfer

文献类型:期刊论文

作者Wei, X ; Wu, AM ; Wang, X ; Li, XY ; Ye, F ; Chen, J ; Chen, M ; Zhang, B ; Lin, CL ; Zhang, M ; Wang, X
刊名JOURNAL OF THE ELECTROCHEMICAL SOCIETY
出版日期2010
卷号157期号:1页码:H81-H85
关键词LOW-DOSE SEPARATION BURIED-OXIDE THERMAL-OXIDATION FILM SOI WAFERS
ISSN号0013-4651
通讯作者Wei, X, Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
学科主题Electrochemistry; Materials Science, Coatings & Films
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/94689]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Wei, X,Wu, AM,Wang, X,et al. Investigation on Silicon on Insulator Fabricated by Separation by Implanted Oxygen Layer Transfer[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY,2010,157(1):H81-H85.
APA Wei, X.,Wu, AM.,Wang, X.,Li, XY.,Ye, F.,...&Wang, X.(2010).Investigation on Silicon on Insulator Fabricated by Separation by Implanted Oxygen Layer Transfer.JOURNAL OF THE ELECTROCHEMICAL SOCIETY,157(1),H81-H85.
MLA Wei, X,et al."Investigation on Silicon on Insulator Fabricated by Separation by Implanted Oxygen Layer Transfer".JOURNAL OF THE ELECTROCHEMICAL SOCIETY 157.1(2010):H81-H85.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。