中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Modified postannealing of the Ge condensation process for better-strained Si material and devices

文献类型:期刊论文

作者Liu, XY ; Ma, XB ; Du, XF ; Liu, WL ; Song, ZT ; Lin, CL
刊名JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
出版日期2010
卷号28期号:5页码:1020-1025
关键词ON-INSULATOR MOBILITY ENHANCEMENT FABRICATION RELAXATION MECHANISM SILICON
ISSN号1071-1023
通讯作者Liu, XY, Chinese Acad Sci, State Key Lab Funct Mat Informat, Lab Nanotechnol, Shanghai Inst Microsyst & Informat Technol, 865 Changning Rd, Shanghai 200050, Peoples R China
学科主题Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/94743]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Liu, XY,Ma, XB,Du, XF,et al. Modified postannealing of the Ge condensation process for better-strained Si material and devices[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,2010,28(5):1020-1025.
APA Liu, XY,Ma, XB,Du, XF,Liu, WL,Song, ZT,&Lin, CL.(2010).Modified postannealing of the Ge condensation process for better-strained Si material and devices.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,28(5),1020-1025.
MLA Liu, XY,et al."Modified postannealing of the Ge condensation process for better-strained Si material and devices".JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 28.5(2010):1020-1025.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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