中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
SEGREGATION OF CU IMPURITY IN ALUMINUM ON SILICON DURING HIGH-DOSE NITROGEN-ION IMPLANTATION

文献类型:期刊论文

作者LIN, CL ; HEMMENT, PLF ; LI, JH ; CHAN, CWM
刊名MATERIALS LETTERS
出版日期1992
卷号15期号:1-2页码:137-140
关键词NITRIDE IR
ISSN号0167-577X
通讯作者LIN, CL, UNIV SURREY,DEPT ELECTR & ELECT ENGN,GUILDFORD GU2 5XH,SURREY,ENGLAND
学科主题Materials Science, Multidisciplinary; Physics, Applied
收录类别SCI
原文出处http://www.sciencedirect.com/science/article/pii/0167577X9290029J
语种英语
公开日期2012-03-25
源URL[http://ir.sim.ac.cn/handle/331004/98400]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文(1999年以前)
推荐引用方式
GB/T 7714
LIN, CL,HEMMENT, PLF,LI, JH,et al. SEGREGATION OF CU IMPURITY IN ALUMINUM ON SILICON DURING HIGH-DOSE NITROGEN-ION IMPLANTATION[J]. MATERIALS LETTERS,1992,15(1-2):137-140.
APA LIN, CL,HEMMENT, PLF,LI, JH,&CHAN, CWM.(1992).SEGREGATION OF CU IMPURITY IN ALUMINUM ON SILICON DURING HIGH-DOSE NITROGEN-ION IMPLANTATION.MATERIALS LETTERS,15(1-2),137-140.
MLA LIN, CL,et al."SEGREGATION OF CU IMPURITY IN ALUMINUM ON SILICON DURING HIGH-DOSE NITROGEN-ION IMPLANTATION".MATERIALS LETTERS 15.1-2(1992):137-140.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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