Leakage behavior and distortion of the hysteresis loop in ferroelectric thin films
文献类型：期刊论文
| 作者 | Zheng,LR ; Lin,CL ; Xu,HP ; Zou,SC |
| 刊名 | SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES
 |
| 出版日期 | 1997 |
| 卷号 | 40期号:2页码:126-134 |
| 关键词 | LEAD-ZIRCONATE-TITANATE INTEGRATION MEMORIES |
| ISSN号 | 1006-9321 |
| 通讯作者 | Zheng, LR, ACAD SINICA,SHANGHAI INST MET,SHANGHAI 200050,PEOPLES R CHINA |
| 学科主题 | Engineering ; Multidisciplinary; Materials Science ; Multidisciplinary |
| 收录类别 | SCI |
| 原文出处 | http://www.springerlink.com/content/vj5062718063155h/ |
| 公开日期 | 2012-03-25 |
| 源URL | [http://ir.sim.ac.cn/handle/331004/98833]  |
| 专题 | 上海微系统与信息技术研究所_功能材料与器件_期刊论文（1999年以前) |
| 推荐引用方式 GB/T 7714 | Zheng,LR,Lin,CL,Xu,HP,et al. Leakage behavior and distortion of the hysteresis loop in ferroelectric thin films[J]. SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES,1997,40(2):126-134. |
| APA | Zheng,LR,Lin,CL,Xu,HP,&Zou,SC.(1997).Leakage behavior and distortion of the hysteresis loop in ferroelectric thin films.SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES,40(2),126-134. |
| MLA | Zheng,LR,et al."Leakage behavior and distortion of the hysteresis loop in ferroelectric thin films".SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES 40.2(1997):126-134. |
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